Ab initio simulation and optimization of phonon drag effect for lower-temperature thermoelectric energy ARCHNES conversion MA 1 AT NQTITUTE by JUL 3 0 2015 Jiawei Zhou Submitted to the Department of Mechanical Engineering LIBRARIES in partial fulfillment of the requirements for the degree of Master of Science in Mechanical Engineering at the MASSACHUSETTS INSTITUTE OF TECHNOLOGY JUNE 2015 Massachusetts Institute of Technology 2015. All rights reserved. red acted AuthorSignature ....---. . . . . ... . . . . .r..... A uth or .......................................... Department of Mechanical Engineering 7 May 8, 2015 Certified by ......... Signature Gang Chen Carl Richard Soderberg Professor of Power Engineering Thesis Supervisor Accepted by .............. Signature redacted David E. Hardt Chairman, Department Committee on Graduate Students MITLibraries 77 Massachusetts Avenue Cambridge, MA 02139 http://Iibraries.mit.edu/ask DISCLAIMER NOTICE Due to the condition of the original material, there are unavoidable flaws in this reproduction. We have made every effort possible to provide you with the best copy available. Thank you. The images contained in this document are of the best quality available. 2 Ab initio simulation and optimization of phonon drag effect for lower-temperature thermoelectric energy conversion by Jiawei Zhou Submitted to the Department of Mechanical Engineering on May 8, 2015, in partial fulfillment of the requirements for the degree of Master of Science in Mechanical Engineering Abstract In recent years, extensive efforts have been devoted to searching for materials with high thermoelectric (TE) efficiency above room temperature for converting heat into electricity. These efforts have led to significant advances with a record-high zT above 2. However, the pursuit of higher TE performance at lower temperatures for cooling and refrigeration applications receives much less attention. Today's most widely-used thermoelectric materials below room temperature are still (Bi,Sb) 2(Te,Se) 3 material system, discovered 60 years ago with a maximum zT around 1. This thesis develops the first-principles simulation tools to study the phonon drag effect - a coupling phenomenon between electrons and non-equilibrium phonons - that leads to a large Seebeck coefficient at low temperatures. Phonon drag effect is simulated successfully from first-principles for the first time and results compare well with experimental data on silicon. While the common wisdom always connects a significant phonon drag effect to a high thermal conductivity, a key insight revealed from the simulation is that phonons contributing to phonon drag and to thermal conductivity do not spectrally overlap. Even in a heavily-doped silicon sample with 1019 cm-3 doping concentration, phonon drag still contributes to -50% of the total Seebeck coefficient. By selectively scattering phonons contributing to heat conduction but not to phonon drag, a large improvement in thermoelectric figure of merit zT is possible. An ideal phonon filter is shown to tremendously enhance zT of n-type silicon at room temperature by a factor of 20 to -0.25, and the enhancement reaches 70 times at lOOK. A practical phonon filtering method based on nanocluster scattering is shown to enhance zT due to reduced thermal conductivity and optimized phonon drag effect. This work opens up a new venue towards better themoelectrics by harnessing non-equilibrium phonons. More material systems can be systematically studied with the developed simulation tools. Thesis Supervisor: Gang Chen Title: Head of the Department of Mechanical Engineering and Carl Richard Soderberg Professor of Power Engineering 3 4 Dedication To my beloved family. 5 6 Acknowledgement This thesis work would be simply impossible without the help and advice from various people I have met from the first day I entered the graduate school. Firstly, I would like to thank my thesis advisor, Prof. Gang Chen, who provides me the great opportunity to work in a wonderful and exciting research environment, points out the possible directions in the long-term and helps with the tiny problems I met during the research, even though he has to squeeze out his time from the commitments to the department among other things. His inspiring vision and scientific rigor always helps me to shape my research habits. Secondly, I would like to thank Mr. Sangyeop Lee and Mr. Bolin Liao, who are knowledgeable seniors I have learned from. I have spent many hours bothering them on the details and understandings of the density functional theory as well as the transport property calculations based on it. It is hard to imagine how I would move from knowing nothing to the phonon transport and later the electron-phonon interaction without their advice and patience. I would also like to thank my labmates in the nanoengineering group for their generous help, especially Mr. Samuel Huberman, Mr. Lee Weinstein, Dr. Yuan Yang, Ms. Yi Huang and Dr. Yanfei Xu. I would also like to thank Prof. Mildred S. Dresselhaus who has pointed to me a different perspective of phonon drag and shared with me her stories in the thermoelectric research. Finally, I want to thank my family for their support, and many friends outside my research field, for who I would not list the names but who have painted wonderful colors to the sky of my research life. 7 8 Contents Chapter 1. Introduction ......................................................................................... 1.1. Coupled electron-phonon Boltzmann equation............................................................. 1.1.1. Picture of Boltzmann equation ........................................................................... 1.1.2. Electron-phonon interaction............................................................................... 1.1.3. Scattering rates due to electron-phonon interaction........................................... 1.2. Phonon drag effect ........................................................................................................ 1.3. Kelvin relation for phonon drag .................................................................................... 1.4 Experimental investigation into phonon drag ............................................................... 1.5 Organization of thesis.................................................................................................... 13 15 15 18 21 26 30 32 34 Chapter 2. Ab initio approach for transport property calculations .................. 2.1. Density functional theory ............................................................................................... 2.2. Electron-phonon interaction........................................................................................... 36 36 39 2.2.1. Wannier function-based interpolation scheme ................................................. 2.2.2. Electron scattering by phonons ........................................................................ 2.2.3. Phonon scattering by electrons........................................................................... 2.3. Phonon-phonon interaction ........................................................................................... 2.4. Impurity scattering ............................................................................................................ 2.5. Phonon drag modeling ................................................................................................. Chapter 3. Simulation of phonon drag ................................................................. 3.1. 3.2. Intrinsic phonon drag .................................................................................................... Saturation effect ................................................................................................................ 3.2.1. Reduction of phonon drag at high doping concentrations.................................. Cause of saturation effect.................................................................................. 3.2.2. 3.3. Mode contribution to phonon drag................................................................................ 3.3.1. Phonon mode contribution ................................................................................. Electron mode contribution................................................................................ 3.3.2. 3.3.3. Effect of normal scattering and Umklapp scattering ......................................... Chapter 4. Optimization of phonon drag ............................................................ 4.1. Preferable phonon modes for phonon drag .................................................................... 4.1.1. Optimization of n-type silicon with ideal phonon filters.................................. 4.1.2. Optimization of p-type silicon with ideal phonon filters.................................... 4.2. Other Phonon filters ...................................................................................................... 4.2.1. Nanocluster scattering for frequency selectivity ................................................ C hapter 5. 5.1. 5.2. Conclusion............................................................................................ Summ ary ........................................................................................................................... Future work.......................................................................................................................75 R eferences........................................................................................................................ 9 39 42 45 46 48 49 51 51 52 52 55 57 57 59 60 63 63 64 67 69 69 75 75 76 List of Figures Figure 1-1. (a) Illustration of the collision between electrons and phonons, (b) transitions shown in the electronic band and (c) corresponding phonon modes in the phonon dispersion ....................................................................................................................... 18 Figure 2-1. Temperature dependence of the calculated intrinsic mobility in n-type and p-type silicon compared with that of sufficiently pure samples from the experiment. . 45 Figure 2-2. Temperature dependence of the thermal conductivity of pure silicon com pared with the experim ent................................................................................... 48 Figure 3-1. Intrinsic phonon drag effect for (a) electrons and (b) holes in lightly-doped silico n ............................................................................................................................. 52 Figure 3-2. Calculated Seebeck coefficient with respect to doping concentrations for (a) n-type silicon and (b) p-type silicon at 300K and 200K on a semilog plot............... 54 Figure 3-3. Phonon scattering rates due to phonon-phonon interaction (red points) and electron-phonon interaction (blue points).................................................................. 56 Figure 3-4. Phonon mode-specific accumulated contributions to the phonon drag Seebeck coefficient and the thermal conductivity with respect to (a) phonon frequency, (b) phonon wavelength and (c) phonon mean free path.. ......................................... 58 Figure 3-5. Accumulated contribution to electrical conductivity, diffusive Seebeck coefficient and phonon drag Seebeck coefficient, with respect to (a) electron band energy, (b) electron wavelength and (c) electron mean free path.. ......................................... 61 Figure 3-6. Electron mode contribution to the phonon drag effect for (a) n-type silicon and (b) p-type silicon, as well as (c) the phonon mode contribution to the phonon drag effect for n-type silicon.............................................................................................. 62 Figure 4-1. Distribution of preferable phonon modes in wave vector and phonon frequency........................................................................................................................65 Figure 4-2. (a) Contribution of the most preferable modes to the phonon drag Seebeck coefficient at different reduced thermal conductivity values and (b) the enhancement of the factor S 2 / K as a function of doping concentration when phonon modes are selectively scattered .................................................................................................. 67 Figure 4-3. (a) The enhancement of zT compared to bulk crystal achieved by selecting preferable modes at 300K for n-type silicon with respect to the doping concentration and (b) the zT enhancement at a doping concentration of 4 x 10' cm-3 as a function of the tem perature.. .................................................................................................................. 68 Figure 4-4. (a) Contribution of preferable modes to the phonon drag Seebeck coefficient at different reduced values of the thermal conductivity and (b) the enhancement of the factor S2 / K as doping concentration for p-type silicon......................................... 69 Figure 4-5. The enhancement of the thermoelectric figure of merit zT with respect to the 10 volume fraction of nanoclusters using phonon frequency selectivity for n-type silicon with a doping concentration of 1019 cm-3 at (a) 300K and (b) 200K.......................... 73 Figure 4-6. The enhancement of the thermoelectric figure of merit zT if single impurities 74 are used to scatter short-wavelength phonons preferentially......................... 11 List of Tables Table 1-1. Prefactors for different types of electron-phonon collisions..................... 22 Table 2-1. Scattering mechanisms for electrons and phonons .................................. 49 Table 2-2. Parameters used in determining the electron and phonon relaxation times as well as in the calculation of the phonon drag effect.. ................................................ 50 12 Chapter 1. Introduction Understanding the transport properties of solids has a main focus on the interaction between various elementary excitations, among which the interplay between electrons and phonons has played a significant role in particular phenomena such as superconductivity' and the metal-insulator transition 2 . The electron-phonon interaction (EPI) problem was first studied by Bloch3 , Sommerfeld and Bethe , who all assumed the phonons to be in equilibrium (so-called "Bloch condition") when calculating the scattering rates of electrons caused by EPI, because of the frequent phonon-phonon Umklapp scattering. This assumption is well justified and widely adopted for the determination of transport properties of electrons at higher temperatures5 ,6, including the electrical conductivity and diffusive Seebeck coefficient. Below the Debye temperature, however, the phonon-phonon Umklapp process is largely suppressed, and this assumption becomes questionable. The significance of non-equilibrium phonons on the electrical transport properties and especially the Seebeck coefficient was first recognized by Gurevich 7 . The experimental evidence given later by Frederikse8 and by Geballe and Hull9 clearly showed an "anomalous" peak of the Seebeck coefficient at around 40K in To germanium. address this unusual observation, Herring proposed that the non-equilibrium phonons can deliver excessive momenta to the electron system via the EP1'0 ". This process generates an extra electrical current in the same direction as the heat flow, as if the electrons were dragged along by phonons. Therefore this effect has been dubbed "phonon drag"' 0 , which makes itself distinct from the normal diffusive contribution to the Seebeck coefficient derived from the diffusion of electrons. Subsequent explorations revealed that this effect exists in various materials systems, including simple semiconductors newly-emerged ones1'7 systems2 >2 4 19 like silicon1-14 and InSb 1'1 among other , layered structures like Bi20 and Bi 2Se32 1 , lower-dimension and even high-T, superconductors 2 5 . In particular, it has been speculated that 13 phonon drag is responsible for the extremely high Seebeck coefficient experimentally found in FeSb 22 2- 8 . In parallel, the theoretical picture for phonon drag has been . confirmed and further refined by more detailed theoretical models 5 ,2 9- 34 The efficiency of thermoelectric materials is characterized by the figure of merit zT, defined as zT = oS 2 T/Ir, where o-,S,T,iK are the electrical conductivity, Seebeck coefficient, thermal conductivity and absolute temperature, respectively. Thermoelectric energy conversion at lower temperatures (around and below 300K) can benefit a wide range of applications including refrigeration, air conditioning and cryogenic cooling 35 but is also challenging mainly because the normal Seebeck coefficient drops in magnitude while the thermal conductivity increases as temperature decreases. It is therefore tempting to make use of the phonon drag effect for higher-efficiency thermoelectrics in the lower-temperature range via boosting the Seebeck coefficient. Straightforward as it seems, controversies exist as to whether zT can be enhanced at all by utilizing the phonon drag effect. Theoretical models 36 concluded that the optimal zT achievable using the phonon drag effect is much smaller than 1, while the experiment on silicon nanowires has suggested the possibility of reaching zT of 1 at 200K 37. The major concern lies in the fact that significant phonon drag requires phonons to be far away from their equilibrium when subject to a given temperature gradient (or equivalently, with long mean free paths), which usually implies high thermal conductivity. So far it is not clear whether it is possible to decouple the contributions, i.e. keeping a high Seebeck coefficient while reducing the lattice thermal conductivity, the latter of which has recently become a common strategy in increasing the thermoelectric efficiency 340. A further opposition to the use of phonon drag comes as increased doping concentration leads to reduced phonon drag, known as the saturation effect'0 . It has been generally believed that in samples with high doping concentration (crucial in obtaining high electrical conductivity), the phonon drag almost vanishes, which however is an incorrect opinion as we will show later. 14 The key information for a better understanding here is a mode-by-mode analysis of phonon contributions to phonon drag and thermal conductivity. With the recent development of first-principles simulation tools442 , the mode-specific contributions to the thermal conductivity have now become accessible. Obtaining the same information for phonon drag, however, can be exceedingly challenging. Ab initio calculation of the EPI, even when the Bloch condition is assumed, has already been proven difficult due to the ultra-dense sampling mesh entailed, only becoming tractable recently thanks to the invention of an interpolation scheme based on maximally localized Wannier functions4344. A further step towards the phonon drag calculation requires an accurate description of the non-equilibrium phonon distributions when calculating EPI, thus combining the above-mentioned two calculations, in addition to more stringent convergence conditions. We will undertake the task of examining the detailed phonon mode contributions to the phonon drag effect in silicon from first-principles and also explore new possibilities for improving thermoelectric efficiency based on the information thus revealed. In this chapter the theoretical formalism is given first for the phonon drag effect, which allows us to distinguish the contributions from different phonon modes. Henceforth, we will provide the justification of our calculation by looking at the temperature and carrier concentration dependence of the phonon drag effect compared with experiments. We then show that the phonon drag effect can be engineered to enhance the Seebeck coefficient while largely reducing the thermal conductivity by identifying the "preferable" phonon modes and filtering out others. An ideal phonon filter is demonstrated to increase zT in n-type silicon by a factor of 20 to -0.25 at room temperature, with the enhancement reaching 70 times at lOOK. 1.1. Coupled electron-phonon Boltzmann equation 1.1.1. Picture of Boltzmann equation The dynamics of a system relies on the "particle" (for example, electrons and phonons) 15 distributions in the real space and momentum space 45 . A major approximation is made when the single particle distribution function is used to represent all the particles in the system, therefore simplifying the problem into a differential equation known as the Boltzmann equation. Simply speaking, Boltzmann equation describes the balance of the transition of one particle between various available states. There are two major causes for these transitions. One is coming from the forces (or potential gradients in a more general sense) acting on the particles, with examples including electric fields for electrons and temperature gradients for both electrons and phonons. The other originates from the interaction between the particles, also called scatterings. For convenience, the terms of the former type in the Boltzmann equation are often called drift terms while those of the . latter type are referred as collision terms 46 In equilibrium, the distribution functions for electrons and phonons are described by 45 Fermi-Dirac and Bose-Einstein statistics respectively . As the macroscopic fields start to drive the system, electrons and phonons will move away from the equilibrium, and the degree of the non-equilibrium will be determined by the strength of the scatterings 5 . In general, the dynamics of electrons and phonons are coupled to each other due to the electron-phonon interaction which will become clear in later chapters, and the corresponding coupled Boltzmann equations in the steady-state can be expressed as46 f(k)f (k) (fa(k) a,(k) VT - (k)f aT V,()-I(q)q) VT = - na aT where T is the temperature, f(k) aE T(k) &at (1.1) at(q () rA(q) at )e,, e is the electron charge, p is the electrochemical potential (incorporating electric potential and chemical potential) and the velocity vectors v for electrons ( v, (k)) and for phonons (V A(q)) are specified with wave vectors k (for electrons) and q (for phonons), as well as band number a and branch number A (in the following we will restrict our discussion to periodic solids where the Bloch band 16 theory applies). f and N represent the distribution functions for electrons and phonons respectively, with equilibrium state (labeled with a superscript 0) described by 11 fO(k) = +1(1.2) -A)IkBT 1 N"(q) = For electrons, the external driving forces include the electrochemical potential gradient , VV and temperature gradient VT, each of which leads to a current of electron flow 4 5 while for phonons the only external driving force comes from the temperature gradient. of Besides the drift terms on f,(k)-f VT eva( k)a(k)vP ,() aT aE E {Va~)Af the T r*(q) of Eq. (k) 9fa(k) *(k) k~k~e~ph + Ta n,(q)-nO(q) +rT) 8n (q) left-hand-side t )e_,h (1.1), there (q) at e-ph are also collision terms on the right-hand-side, which describe the various scattering events experienced by electrons and phonons. For both electrons and phonons, there are various mechanisms that can make transitions from one state to another. Among these processes, the electron-phonon interaction is most important for our problem because it couples the electron and phonon systems, which essentially leads to the interesting phonon drag effect as we will see below. For this reason, we have separated them out from other terms contributing to the scattering events. Apart from the electron-phonon interaction, we have also considered electron-impurity scattering, phonon-impurity V,(k)- V as aT q) nt (q)- aT well as VT -ev, (k)= phonon-phonon aE VP= n.(q)-no(q) + rz(q) scattering fa(k>- ,f +k) 11)& a(1.1). in Eq. Note ot n (q)1. at processes , scattering e-ph that the combined effect of these scatterings has been summarized into a-mode-specific 17 variable ( * (k) for electrons and * (q) for phonons), called mode-dependent relaxation time. For electrons, z*(k) only includes electron-impurity scattering, while for phonons r*(q) considers both phonon-impurity scattering and phonon-phonon scattering, added together according to Matthiessen's rule. Previously it has been pointed out that in certain materials4 7' 48 (for example diamond and graphene) such relaxation time model is not accurate enough to describe the thermal transport properties. However, generally this relaxation time model leads to good agreement for the thermal transport across a wide range of materials4 9- 53, and has been recently used to study the electrical transport in silicon4'4 , the material we will focus on in this thesis. The use of the relaxation time model will be further justified as we compare the simulation results with the experiments. 1.1.2. Electron-phonon interaction The electron-phonon interaction couples the electron and phonon systems, and is the key factor that leads to the phonon drag effect5 . In the lowest order approximation, electrons and phonons lie in their eigenstates, described by the electronic band and phonon dispersion respectively. Because electrons sit in an environment of atoms, the atomic vibrations (phonons) will therefore affect the movement of electrons. In the particle language, this means electrons can collide with phonons, making transition from one state to another (Figure 1-1). During these processes, energy and crystal momentum conservation need to be satisfied, which impose the conditions on which processes are allowed. (b) (a) k 2 ek e+hk+qW22 18 Ii (c) Figure 1-1. (a) Illustration of the collision between electrons and phonons, (b) transitions shown in the electronic band and (c) corresponding phonon modes in the phonon dispersion. In part (a) k1 is the initial state of the electron, which is scattered to the final state k 2 via the absorption of a phonon mode q. As we see from the illustration in Figure 1-1, the electron-phonon interaction is a three-particle process and therefore the corresponding term in the Boltzmann equation va(k)- afa(k) Vfe(k).(k) VT--eva(k)- c f, (k)f-f,(k) zVCP=- aT (Eq. aT a ep (k)(1.1) an,(q) n,(q)-no(q) T VT=(q) v(q). - (fa(k) + at r*(q) )_,i involves distribution functions in three different states: the initial electron state, the final electron state and the participating phonon, each characterized by fka, fk,,' and n,,, respectively. The rate of the transition processes (also called the scattering rate) depends on the occupation numbers of these states and typically involves prefactors like fk, (1 - fk,,),2 (k -* k' via phonon absorption), which means for an electron to absorb one phonon, the probability of the scattering is proportional to the probability of finding the electron at the initial state, the probability that there is position available for the electron at the final state and the number of phonons, which essentially derives from the quantum statistics of electrons and phonons. The coupling between electrons and phonons is described by the coupling matrix element in the language of quantum mechanics. The eigenstates mentioned before for electrons and phonons are only approximations to the true states of the system. This is because in the real system, the Hamiltonian will deviate from the ideal case and eigenstates assumed for each are not true eigenstates of the whole system5 . However, since usually the deviation is small, we can regard this as a perturbation to the original solutions and therefore use perturbation theory to determine the real dynamics of the system. Electron-phonon interaction is one of such perturbations, which means that the Hamiltonian, which represents the total energy of the system, has non-zero overlap 19 between the electron and phonon states. In an intuitive way, Bloch wrote down the contribution to the total energy due to the combined effect of electrons and phonons54 SE = urR -E rR (1.3) _11 r,R 0 where u is the displacement of the atom, r describes different sub-lattice atomic sites, R distinguishes different unit cells, and E is the total energy of the system. A simple explanation of this equation is that, as the atoms in the system move around, the electrons will adjust themselves to find the lowest energy for that atom configuration and therefore , the total energy also changes. Born-Oppenheimer approximation is often assumed5 which states that as the atoms vibrate, electrons respond so fast that they almost see a static atomic configuration and therefore finds the lowest energy corresponding to that configuration. This simplifies the problem because electrons and phonons still have their own eigenstates, and are only coupled to each other via coupling matrix element. Models go beyond this approximation often consider "vibron" which is a combined state of electron and phonon in a general sense5 5 (Note that there are also different types of vibrons suited for different problems). For our problem, the Born-Oppenheimer approximation applies well and we will restrict our discussion to this picture. The explicit coupling term, as given in Eq. SE = IUrR rR aE r,R (1.3), will not be useful for the transport property until we consider how it is incorporated into the Boltzmann equation. This is accomplished by applying the Fermi's golden rule, which determines the transition probability (or scattering rate) when the perturbation induces coupling between different eigenstates (electrons and phonons in our case). As a first step, Eq. SE IUr,R r,R - (1.3) needs a more rR explicit expression. As shown by Ziman56 , the intuitive expression given by Bloch can exactly match the results obtained from more rigorous quantum mechanics derivation, if 20 we regard uR as operator acting on the phonon eigenstates while F as operator OI"r,R acting on the electron states. This simple interpretation clearly couples the electron and phonon system as we expect, and the electron-phonon coupling matrix element can be explicitly described by (n,, 1u n)-(k'aq,,Vjka) (1.4) where we have transformed the change of the energy due to the displacement of one OE single atom to the potential change due to a collective atomic motion ar,R corresponding to a certain phonon mode with wave vector q and branch number A (defined as @qV ), which varies in the real space and will be referred as the (phonon-induced) perturbed potential. Ika) and Ik'f8) describe different states that are coupled through the perturbation, and jnq,) represents the phonon state (Note that it is characterized by the number of phonons and the final state can only differ by one). The first term in Eq. (n, I u In,,)-(k'p8jjVjka) (1.4) essentially leads to the proportionality to the number of phonons as we mentioned before for the scattering rate. The second term, which includes electron states and perturbed potential, is the key element that is required for describing the scattering rates in the Boltzmann equation and thus the calculation of transport properties. For convenience, we define the electron-phonon interaction matrix element as j gf6A(k,k,q) = ( (k',6 IOqV Ika) (1.5) 2mco,1/ which only differs from Eq. (nqA 1 li n,) - (k'pJ V ka) (1.4) by a prefactor inversely proportional to the square root of the phonon frequency. In Eq. 21 C+()f +h EEs G) q+ k+ 6)(k'-(1-f n +1g(n(kk',q) n(k,)k2,cq) h g,6(k,k',q)= (1.5) -(k'fiVaqAVka) h is the Planck is the electron mass. constant and m 1.1.3. Scattering rates due to electron-phonon interaction With the electron-phonon matrix element written down, now we can apply the Fermi's golden rule to calculate the scattering rates due to the electron-phonon interaction. More the ()" V(k)a T EPI-induced v,(k) scattering terms (last f,(k)-f(k) (k) V,(q)(q)q)VT=-n aT in Eq. 8fa(k) VT ev(k)aE ((k) + n(I. z(q + terms at ) specifically, are a t rj(q) &)e-ph described by (af1(k) at 2rr ,_-h - nqAfka0- + 1)fka(1 A(kk',q)2(n., h k'#lqA + ga,,, (k',k,q) + ga,, (k',k, q)1 ( a- fk,A,,(k (nqA + -Iga, (k~k',q) anA(q) at 2;r I E )ep, h 2 kak'fl fkf,)S(k'-k - q + G)6(E,, - Eka - hoqA) fk,,)S(k'--k + q + G)8(Ek,, - Ek, + hpqA) -k'-q+G)(E, - E, - hcq2 ) -jga,(k,k',q)j 1)(1 - fka)fkg(k -k'+ q + G)S(Eka - Ek,, + hcoq) nff(1 -fk)(k'-k -q+G)(E - Eka - ho) )qA) 12ka + g-,4(k',k, q) n1a(1- fkG)fkS(k -k' +ga,(k',k,q)1 (nq, +1)(1 - fka)f,6S(k - q+ G)(Eka - Ek, - hcoqA) -k'+ q + G)6(Eka - E,, + hcq) (1.6) where the electron-phonon interaction matrix element g,6A(k,k',q) gafpA(k,k',q)= 2mocWo .(k'fiaqAVjka) is defined in Eq. (1.5). In Eq. (1.6), Ekc and Ek,, describes the energy of electron states and c,, describes the phonon frequency. The energy conservation is imposed by the last delta function while the crystal momentum 22 conservation is included by the delta function next to it, which describes either Umklapp process or normal process depending on whether extra reciprocal lattice vectors are required to bring the difference of the wave vectors to zero. Note that for the scattering rate for phonons there is an extra 1/2. This is because when k and k' go over the Brillouin zone each k, ->k 2 process is counted twice (let k = k, and k'=k2 or vice versa). Here we want to make simple comments on the physical meanings of these complicated expressions. As we expect, the scattering rates involve the distribution functions of three different states, and the dependences are clearly different for different types of processes. For the electron as an example, we list in the following the corresponding prefactors for different processes, which are similar to the phonon absorption process (k --+ k' via phonon absorption) we mentioned above. Table 1-1. Prefactors for different types of electron-phonon collisions qk q k k q k -> k' phonon absorption fka (1- fk'/O)qA kq k k' -> k phonon absorption k -> k' phonon emission fA (1- fki)(qI + (1 1) f ka )fkyJOnq k' -> k phonon emission (1 f ka ) fk'pO(qA + 1) Besides, the energy and crystal momentum conservation are seen as the delta functions, automatically imposed when applying the Fermi's golden rule. The scattering rate is proportional to the magnitude squared of the electron-phonon coupling matrix element and therefore the coupling matrix serves as a quantitative parameter that determines the strength of the interaction between electrons and phonons. 23 The solution of "kVT - ev, (k) - V, (k)- VT V the Boltzmann " aE a(q)n()VT=-na -n aT rA(q) equation described f, (k) - fa (k) +f() (k) *a(k) + &t by Eq. )1_ na ( at e-ph combined with Eq. (1.6) is not as straightforward as it seems. This is because it is a non-linear equation and it is generally harder to find its solutions in a robust way than solving linear equations. However, we note that in equilibrium, all distribution functions should take their equilibrium values and the scattering rates therefore vanish, because otherwise the state of the system will move away from the equilibrium (see Eq. F fa(k)-f0 (k) k + r8fa(k)~ 8k' VT - ev, (k) V(P= Va (k)-A,(k)vTev\.fa(k)v T an( (q) VT f, (k) = +(q) an (q) -n A(q) + at )e-ph (1.1)). This t(q) _ph -t inspires one to take the lowest order approximation for Eq. (1.6), or the first order deviation of the distribution functions, which gives rise to the widely-used linearized Boltzmann equation: I,, f ([Ik):[ - F (k', q A) -Afk, + (ka,qA)- Af + F (ka,k'8)- An )-ph e~ (q) k',,qA =I S e-ph I- k',,qA [Gk.(k'/, qA) -Afka +Gk,,(ka,qA)- Afk k',,qA Gq (ka,k'fl) -Anq ]ka,k'f ka.k'l (1.7) where the coefficients F and G only depends on the equilibrium distribution functions: 24 +- _(n,, F..,,(ka, qA) = [no, + I- fo,,) r_ + (nq I + F,,(ka, f") +(n,,2+-f") (k) F(k'p,qA) Afka [Fk ,(ka,qx) Afkfl] + [Fq,(ka,k'p) -Anqx] k'8)= Gk,(k'#, qA)= Gs,,(ka~q) f 0- 0a)-f9 -f~ U [(Akfl - n n G,fl(ka,k'p) = [(n fkg"l + Fk, (k'#, qA) = [n,,+ fk",fl f,0a Aka + (k~fl- Aa +(1.8) + +- fk' )H - - 0,H n4+ - (no - -fk)1 0a with Hr S= hga,,(k,k,q) -g(Ek, S= Eka hIg,(k,k',).5(E,, -E -h2)-.5(k'-k -q) + h coq,2)-.(k'-k+q) denoting processes due to the absorption of a phonon respectively. The AnqA = n2 - n", first-order deviations Afa Wq2 fk and the emission of a phonon, Af =fk', - f and ,, - characterize the non-equilibrium state of electrons and phonons. Note Eq. in that k) [ZF(k'6,qA) Ff -Afk, + Z [F,,(ka,qA)-Afki]+ I e-ph - k', qA anG(q) ),(k'_,q)Af,+Gk,,(ka,q)-Af,]-eat -ph [F,(ka,k',6)-An, k# qA k',,q Gqjka,k'p) kak', An, I _kak', (1.7) we have re-grouped the contributions so that the dependence of the scattering rates on each non-equilibrium state is clearly seen. For normal electrical property calculations, the relaxation time approximation is often used. This approximation naturally arises if we assume that for the electron scattering (first in line _ a -p h t () e-ph k',,qA ka,k', k ,q k',,q [G a(k'/,q).Afka +Gk.,(ka,q2). Afk,]- 25 _ka,k', Gq (ka,k')] Anfq2 I Eq. [k', (1.7)) only the distribution of the initial state of the electron deviates from the equilibrium ( Afgk # 0 ) and that of the final electron state and of phonons remain at equilibrium (Afk,'a =0, An, =0 ), which is essentially the Bloch condition. In this case, the prefactor before Afk, (k). The relaxation time can be defined as 1/ ir.-P(k) is what is usually called the electron-phonon relaxation time (for electrons), which determines the intrinsic mobility of one material. We should also note that Afkf, because the terms containing Afkf is essentially neglected sum up to approximately zero. In metals and for elastic scattering with impurities, this approximation is not valid and therefore an extra correction term (1- cos 0) is often added to the electron-phonon relaxation time, which 6 is called the momentum relaxation time . In semiconductors, however, it is proved, based on deformation potential models, that for nearly isotropic scattering, the neglect of AfJ, will not cause much difference. It has also been shown 7 58 that without considering Afk,,, good agreement for the electrical properties in silicon with experiments can be achieved, justifying the approximation that terms containing Afk,'O can be neglected. A more important perturbation term from equilibrium comes in the evaluation of the assumption Anfq =0. It is clear that this assumption makes non-equilibrium phonons have no effect on the electron system. When phonons are far away from the equilibrium, assuming Anq,, to be zero is no longer valid. These non-equilibrium phonons described by non-zero (k)F k', A at ),-ph On, (q) ) Anq 2 in the electron system (the last term in the first line of Eq. =f j(k'p, q Af +I Fk,,(ka, g)- Af + F,(ka,k'p)-Anq, ] _k',,A I ~=ph [kG,(k'?, qA) -Afk, + Gk, (ka,q)- fl.J - (1.7)) are responsible for the phonon drag effect. 26 Gq,(ka,k'8)j- An, The above picture describing the phonon drag effect is based on the Seebeck effect, where a temperature gradient induces a phonon heat flow (characterized by non-zero An,), which delivers part of its momenta to the electron system and gives rise to an extra current. Because of the Kelvin relation H = TS, an extra contribution to the Seebeck coefficient also implies an extra Peltier coefficient. This is manifested by the first two af (k) S terms -[ Fk,(k'pf,qqA) =I at )-ph ka,k'$ the second line Afk, + Z [F,,(ka,qA)-Afk,]+ j k6qA he-ph an, (q) in k',qA I of Eq. [F,(ka,k'p)8 -qAn] k',6qA [Gka(k'p,qA)- Aft. + G.,(ka, q)- fAfk,]- Ga(ka,k'p)- An, 2 _ka,k'# (1.7), which transfer the momenta of the electron system to phonons when an electrical current is applied through the system. We will discuss the Kelvin relation later with more details. we look at Fk (k'8, qA)j- -k -I at -ph an,, (q) at k'#,qA I ),_ph the last term Afka +Z [F in the second ,O(ka,q2)- Af k'p,qA of Eq. F (ka,k'p) -An k'p~qA [Gka (k'f, qA) -Afk, + Gk. (ka,qA)- Afk,]- Gq,(ka,k'p) -An, ka,k# ka,k'l + I line , If I. (1.7), the prefactor of AnqA in the phonon Boltzmann equation can be readily written as 1/ r 7 -Ph(q) (just as the definition of electron-phonon relaxation time for electrons), which denotes the process that phonons are scattered by electrons at equilibrium. As a result, higher doping concentrations (more free electrons) lead to stronger scattering for phonons. Normally when considering the phonon relaxation times, the electron-phonon scattering is neglected because phonon-phonon scattering dominates the scattering processes. However, as the doping concentration increases, there will be increasing probability that phonons get scattered by electrons. It is found from the simulation that this phonon scattering by electrons account for some fraction of the reduction of the thermal conductivity in heavily-doped materials59. Furthermore, as we will see in later 27 chapters, it is also responsible for the reduction of the phonon drag effect in heavily-doped samples compared to lightly-doped samples (the saturation effect). af"(k) VT -ev,(k) aT =-nA(q) -n (q) r(q) t 'an 2 (q) at term in Eq. f,(k)- f(k) at a +( r (k) e(k) )ep/ (1.1) and Eq. ang(q) N at Fa(k'#, qA) -Afk + I Ia k'$,,A I-Z e-ph each + =-[ )e-ph of )e_,h [Fk(ka,q)-Afkj+ k',,A k F k'#,,A [Gk (k'#,qX)-Afka+ Gk.,(ka,qA)-Afk,, Gq,(ka,k'8) -An - , I aT af, (k) K E v (q)- an(q) VT [pt(ka,k'fl)-An,, meaning the ) t Va(k)- discussed " Having ka,k'# ka,k'p I (1.7), now we want to make the inclusion of these scattering terms more compact by rearranging them. If we incorporate the first term of the right-hand-side in the first line of tf Eq. (k) a -[ I: Fk,, (k'8,qA) -Afka + I e- ph an(q) at t (1.7) Z [G,(k'8,q e-ph and [F,,,(ka,q2)-Afk,]+ )Afa+ Gk,,(ka,q)-AfkJ-ka,k' last term [F 2(ka,k'6)- An,, k',Aq ka,k' the I k'6,qA I in the Gq,(ka,k'p)]-An,2 I second line of Eq. in Eq. [F,,(ka,qA)-Afkf]+ [F(ka,k'p)-Anq1 [ )e-ph k'qA at k',,A [Gk (k',q2 )-Afa +G,, (ka,qA)),-ph (1.7) k',,A into v,(k) VA(q)-n the 2 ka,k'6I relaxation '(kVT-eva(k)J- aT Af ka,k'# ' (k) -Z F(k'8,qA) -Af + Z _k',,A times "V( VT=- n. (q)-n r*(q) we already k)-f (k) =0 r,(k) ) n at coupled Boltzmann equation now becomes 28 Je-ph f(k) at have N )e_,h (1.1), the " =_f- "(k)-f:(k)+ at d,,ft r,(k) Z [FkF,,(ka,qA) - Afk,,]+ Z [F, 2(ka,k'p)-Anqj k,',qA ang(q)n,, S -(q (q) -no () + ,ri A(q) at k,8,qA Z [Gk,(k'p,qA)- Afka +G,,(ka,qA)- Afk,)o ka,k7,( (1.9) where new relaxation times include part of the electron-phonon coupling (scattering of electrons by equilibrium phonons as well as scattering of phonons by equilibrium electrons) = -k) + GqA(ka,k'p8) +F,(k'O, r()r(k) 'Oq '-a qA) (k) (1.10) = A) r,(q) kak and the remaining terms describe the coupling between non-equilibrium states in the electron and phonon systems. 1.2. Phonon drag effect We have above derived the coupled electron-phonon Boltzmann equation in a compact form as at ",= ift an-(q) at k - O"k +Z [Fk,,(ka,qA)- Afk,,]+ Z [F,,(ka,k'p)- Anqj r,(k) k'/,qA n, (q)-no(q) + ),if, shown Tr(q) I kak'p in Eq. k,,,q2 [Gk.(k'pqA)- Afk, +G, (ka,qA) - Afkj (1.9). The electron relaxation time ra (k) incorporates electron-impurity scattering and electron scattering by equilibrium phonons, while the phonon relaxation time T. (q) contains phonon-phonon interaction, phonon-impurity scattering and phonon scattering by equilibrium electrons. The coupling through the non-equilibrium distribution is manifested by the collision terms that are not described by the relaxation times in Eq. 29 t at =dft "(k f(k -r,(k) n. 2(q) at )dri - + IfF,( [ (ka,qA)-Afk,,]+ F [, (ka,k'8) -LAnq,, kflqA no(q) + Z [Gka(k'fl,qA)- Afka +Gk (ka,qA)- Afkf] r(q) (1.9), which are responsible for the phonon drag effect. In this section we will derive the phonon drag Seebeck coefficient based on these equations. We will adopt the Peltier picture, where an isothermal electric field is applied to drive the coupled electron-phonon system. We choose this approach because it directly provides the phonon drag contribution from each phonon mode. The derivation based on fundamental relation between the Seebeck coeffient S and Peltier coefficient I - the Seebeck effect will be discussed in the next section, which clearly shows that the Kelvin relation - still applies to the phonon drag effect. For the Peltier effect, a non-equilibrium distribution of electrons Afk, is generated first by the electric field, which will then drive the phonons away from the equilibrium. However, the determination of Afk, requires the knowledge of Anq. , which also appears in the electron Boltzmann equation and makes solving fully-coupled Boltzmann equations a " at raf an(q)J at )dri formidable task. One further "= ,f (k), - + 1 [F1,,(ka,q2) -Afk,,]+ E [F 2(ka,k'p)- Anq, T,(k) k,',qA - step towards solving Eq. k,,,A (q) -ni(q) + [Gka(k'f,q2) Afka +Gk,,(ka,qA)- Afk,] rA(q) ka,k'# (1.9) is to realize that the influence of the current-induced non-equilibrium phonons on the phonon drag effect, indirectly through affecting the non-equilibrium electrons, is a higher-order effect, which can be justified by the fact that the phonon drag phenomenon is found to have a small influence on the electrical conductivity. Therefore for the electron system, we can then assume that phonons are at equilibrium (An,, =0 can be assumed in the first 30 line of Eq. =)t,(k - " ) "(k) + Z [Fk, (ka,qA)- Afk,,]+ I [F,,(ka,k')#)-An ] [ (k) ,ra rft 2 (q) k,6,,A k,',q n2 (q)-n"(q) An + Z [Gk,(k'#,q)- AfG +Gk,,(ka, q)- Af],,) ka.k,/ ,,rr(q) &t (1.9) and note that for the Peltier effect the phonon drag comes in through the last term in "a = at k) - ) "(k) + I [F,,(ka,qA)-Afk,,]+ n,,(q) n at drif, S( I [F2(ka,k'i)-Anq 2] k/J,qA k,',qA ra(k) )dft Eq. of line second the q + ka,k',i[Gka(k'p,q) - Afka +G,,(ka,q)- Afk,)] n 2 (q)-n(q) -rA(q) (1.9) instead of the last term in the first line). As a result, the electron-phonon Boltzmann equation can be partially decoupled, which leads to a feasible computational approach for calculating (phonon drag contribution to the Seebeck coefficient). Now the electron Sph distribution function can be directly written down using the relaxation time model V,(k) Eq. f,(k) "(k) E (VT-ev(k) aT a r(k) T(qk) -a 01 (q) A)- VT=-n VA (q)IT + -r(q) we also assume that the term _f_(k) ( (see Afea eavk =- + at eno(1.1); here )e_,h n~q at )e-ph F,(ka,qA)-Afk,,] will vanish, which is a k',f,qA commonly used approximation as discussed in section 1.1.3). The normal electrical conductivity and Peltier coefficient (related to the normal Seebeck coefficient via the Kelvin relation II= TS) can be obtained by looking at the charge current and energy current induced by such a non-equilibrium electron distribution, respectively: 31 3 KNk < kA "." 3o7Nk 3Nk I (E -pfka k(-lVxafc;a/ e = 2 -af=V(E ka kI )/(V) 3Nk (E f1)Va DE) aka ka J(1) " Or13Nk ka &E) k where o- is the electrical conductivity, H is the Peltier coefficient due to diffusion of electrons and Nk is the number of points in the discrete reciprocal space mesh for electrons. The Peltier coefficient shown here, only includes the energy current of the electrons, and will be denoted as "diffusive" Peltier coefficient Haif in the later part (and corresponding diffusive Seebeck coefficient Sdaff). Besides this, the energy current also has its origin in the phonon heat flow. As we have discussed, in the isothermal condition the phonons acquire the momentum via the electron-phonon coupling shown by I(n,(q) the last " at term =- ,drift the + Z ,( -r (k) )dri, _ _n at in Z line [F,,(ka,qA)-Afkfl]+ I k,,,, (q) - n (q) + -r(q) second of Eq. [F,(ka,k'#f)-An] k',f.qA [Gka, (k'6,q)- Afka + Gk,, (ka, q2)- Afk,,) ka,kfl (1.9) and lead to an extra heat flow, which manifests the "phonon drag" effect (In this case "electron drag" might be a more suitable word). Given the electron distribution Afka, the phonon Boltzmann equation now becomes +eV (q)n,(q)-no(q) +erpr= - kaG ,(k'fJ, q2)re Vka +Gk,, (ka,q),rkv, E kaf(q) Lak, af[G# aE aE (1.12) where the drift term vanishes because there is no temperature gradient. It can be readily solved to obtain the phonon distribution function 32 An,(q) = r( - G (k'V,qk)va " +Gk,,(ka,qA)rkv,, V W l ka,k',f (1.13) Considering the heat flow described by q= hoqvq,,AnA and the Kelvin relation, we finally arrive at the formula describing the phonon drag Seebeck coefficient: Sph= 2 2 3onNkNq kT Jhq,~qAq~.* q L- with HI= r gafl(k,k',q) .(Ek, - Eka - hoq)- 5(k'-k where e is the electron charge, u is the electrical conductivity, volume, Nk and Nq h (TkaVka _'kfiVkflk41kfllq ,kakf, fa(1.14) -q) 0 is the unit cell are the number of points in the discrete reciprocal space mesh for electrons and phonons, and the term inside the bracket of Eq. (1.14) is the phonon drag contribution (neglecting the common prefactor) from each phonon mode. Equation (1.14) essentially describes the momentum delivery from non-equilibrium phonons to the electron system via EPI. The total Seebeck coefficient is obtained by summing the diffusion contribution and the phonon drag contribution, i.e. S = Sdif + .ph* Here we briefly comment on the various models used by previous work to study the 10 phonon drag effect. In Herring's original paper , an intuitive formula was used to estimate the phonon drag magnitude, which is proportional to the relaxation time of phonons that can deliver the momenta to the electron system and inversely proportional to the relaxation time of the electrons. A more rigorous analysis based on solving coupled electron-phonon Boltzmann equation was also discussed, with the results mostly focused on the scaling analysis'0 . Following this, Ziman introduced a variational method to solve the coupled electron-phonon Boltzmann equations5 , by first recasting the Boltzmann equation into a variational form describing the entropy generation rate in the system. Therefore solving the Boltzmann equation, in Ziman's approach, becomes a functional minimization problem. Using this method, Ziman showed the order of magnitude of the 33 phonon drag Seebeck coefficient in metals is around a few kBT . Bailyn further extended this variational method to study the phonon drag with more details 29. There are some major assumptions used by Bailyn: (1) For phonons, dominant phonon-phonon scattering is represented by relaxation time approximation; (and possibly approximation; electron-electron (3) scattering) The electron-phonon (2) For electrons, impurity scattering is represented interaction is by relaxation represented by time transition probabilities, with assumed perturbation potential. The first two assumptions also serve as the basis in our derivation, but the model of deformation potential is no longer required because the information of perturbed potential can be obtained from first principles calculations. Our formula presented above is identical to the results given by Cantrell and Butcher 32 who assumed weak electron-phonon coupling to ignore the effects of non-equilibrium phonons back on the phonon system (Seebeck picture). It was argued for GaAs that the electron-phonon scattering indeed can be neglected when considering the phonon transport. However, our previous derivation has shown that this assumption can be relaxed and in later chapters we will demonstrate that a wider agreement with experiment can be achieved within this formalism. Particularly, we will study the whole doping concentration range with the saturation effect taken into account, which is crucial for evaluating the thermoelectric property (typical thermoelectric materials have high doping concentrations) but not examined by previous work. 1.3. Kelvin relation for phonon drag The above derivation is based on the Peltier picture, for which an isothermal electric field drives a charge current, which transfers the momenta to the phonon system and gives rise to an extra heat flow. Here we want to further clarify the phonon drag effect in the context of the Seebeck effect, which completes the picture and provides a clear proof for the Kelvin relation applied to the phonon drag effect. 34 For the Seebeck effect, a temperature gradient drives the phonon flow, which then transfer their momenta to the electron system via the non-zero Anfl appearing in the electron line Boltzmann equation = - fa(k)f(k) at 2 (q) - at )drif, in k,(k) - nG(q) + I the first of Eq. [q,(ka,k'6).Anq, k',,2 [G, (k'fl,qI) Afk, +G,,,(ka,qA)- Afkf) fk, k,k', TA(q) - term + Z[F,(ka,q)-Afk, ]+ -a drift (last (1.9)). Similar as before, we realize that the influence of non-equilibrium electrons on the phonon drag effect, indirectly through affecting the non-equilibrium phonons, is a higher-order effect (i.e. Afk, 0 can be assumed in the phonon Boltzmann equation). Accordingly the non-equilibrium phonon distribution can be directly expressed as AnqA2 = rqAv,2-VT at n0 and q, aT the electron a=ak - kL(k) + Z [F,(ka,qA)- Afk,,]+ drft r,t (k) k,',q a Bngn ) ()n(q) =at ,,, - n"(q) ) ) + I (q) ka,kf, Boltzmann equation in Eq. [,(ka,k'6)- Anq,] W,6, [Gk,(k',q2)- Afk, +Gkfl(ka,qZ)- Afk,,] (1.9) can then be readily solved given the phonon distribution function (for the electron Boltzmann equation we again assume that the term [,(ka,qA)F Afk, ] will vanish). Considering the electrical current density described by j= e Vkagfka, afr ka some rearrangements we will find that the same equation (Eq. (1.14)) is derived, describing the phonon drag contribution to the Seebeck coefficient. We note that the two methods' merging into the same result is not a coincidence. In fact the Kelvin relation can be derived from a more fundamental law - the Onsager's reciprocity theorem. This theorem states that linear reciprocal processes (examples include thermoelectrics, piezoelectrics, pyroelectrics, etc.) are not independent of each other, and simple relationships can be established essentially originating from the detailed 35 balance under the time-reversal symmetry. In our problem, since the time-reversal symmetry is not broken, the Kelvin relation should still applies as for the normal diffusive Seebeck coefficient (and Peltier coefficient). 1.4 Experimental investigation into phonon drag Apart from the experimental work mentioned in the beginning of the introduction in which the phonon drag is discovered in various materials, here we discuss some of other experimental work that dived into the details of the phonon drag, which potentially lead to further manipulation of the phonon drag effect. One difficulty associated with phonon drag is that simple thermopower measurement cannot distinguish between the contribution from the diffusion of electrons and the phonon drag effect. At low temperatures, it is believed the phonon drag dominates the measured Seebeck coefficient since theoretical models predict a low value for the diffusive Seebeck coefficient. At higher temperatures (for example around room temperature), however, the phonon drag effect becomes weaker, and as a result there is ambiguity in how much the phonon drag contributes to the total Seebeck coefficient. The experimental work by Trzcinski et. al. seeks to provide such information by "quenching" the phonon drag contribution at room temperature 60. They designed a point contact device where two tips make contact only at a small region, where the temperature gradient is applied across the point contact and the voltage bewteen the two ends is measured. Because phonons that contribute to phonon drag typically have long mean free path (a qualitative understanding since Herring's work'0 ), it is expected that the Seebeck coefficient will decrease as the phonon drag makes less contribution if the contact area is reduced. In this way, they found that the phonon drag still plays a role at room temperature. However, because it is not clear how much the point contact geometry destroys the phonon drag, it is hard to reach quantitative conclusion on the contribution of the phonon drag. 36 The other approach to examine the phonon drag is to study the effect of nanocomposite on modifying the phonon drag magnitude. It has been known for a long time that sample size will affect the phonon drag at very low temperatures due to boundary scattering of phonons9"0 . Recently, making nanocomposite materials has become a standard way to . reduce the thermal conductivity, thus improving the thermoelectric performance3 8 However, it is not clear how this approach will be applied to materials with large phonon drag effect for cryogenic cooling applications. Experiments on FeSb 2 have been conducted 27 , which showed greatly-reduced thermal conductivity, but also with a largely-compromised Seebeck compared to the peak of - coefficient -45000pV/K (hundreds of pV/K in nanocomposites in bulk crystal). Although debates exist for whether the large Seebeck coefficient in FeSb 2 is due to phonon drag or Kondo effect, the experiments in the first place provides a clue into the mechanism of the Seebeck coefficient, indicating that FeSb 2 might have significant phonon drag, which is largely reduced due to the scattering of long wavelength phonons at the grain boundaries. Furthermore, if this argument is true, it also poses the question as how one should reduce the thermal conductivity with minimum detrimental influence on the phonon drag effect. As we have mentioned in the beginning, phonon drag will also be weakened if the carrier concentration is increased (so-called saturation effect1 0). Although we will uncover that even in heavily-doped samples the phonon drag still makes sizeable contribution to the total Seebeck coefficient and thus contradicts previous beliefs that phonon drag almost vanishes at high doping concentrations, it is still desirable to minimize the effect of the high-level doping on the phonon drag. One idea is to separate the doping region where charges flow and the phonon active region where non-equilibrium phonons are generated. A simple geometry could be a heavily-doped conductive layer deposited onto an insulating substrate. Under the in-plane (along the interface) temperature gradient, non-equilibrium phonons will be generated in the substrate, which experience less scatterings (because these phonons mostly see a 37 low-doping level environment) but couple to the phonons and also electrons in the conductive layer and therefore produce extra electrical current through the electron-phonon coupling. It is then expected that the peak of the phonon drag will follow the phonon properties of the substrate instead of the conductive layer, which has been 61 shown by the experiment conducted by Wang et. al. , who have claimed that such thin-film-on-substrate geometry could be a way to tune the phonon drag property (in this case the phonon drag of the thin film is tuned by the phonon properties of the substrate). However, this simple structure is not very useful for thermoelectric applications because the substrate is thick compared to the conductive layer, and therefore the large thermal conductivity through the substrate compromises the thermoelectric efficiency. One way to circumvent this problem is to make stacked structure of conductive layer and insulating layer, or superlattices, which is examined in the work of Ohta et. al.2 3 , where superlattices of alternating SrTiO 3 and SrTio.8No.20 3 are used and conduction electrons are strongly confined in SrTio.8Nbo.20 3 layer, essentially forming a 2D electron gas. It is argued that the phonon drag leads to the large Seebeck coefficient observed in such superlattice structure and gives rise to the high thermoelectric efficiency, which could benefit from the separation of the doping region and the phonon active region. 1.5 Organization of thesis Despite of the efforts that have been devoted to manipulate the phonon drag, currently it is still hard to rationally design the materials and also structures due to a lack of the quantitative knowledge of how much each phonon mode contributes to the phonon drag effect in different temperatures and doping concentrations. In the following we will use an ab initio approach to study the phonon drag effect, providing such detailed information of the role of each phonon, thus bringing the optimization of the phonon drag into material designs for better thermoelectric performance. The organization of this thesis is as follows: Chapter 2 provides the details of the ab initio computational 38 approach we used and developed to calculate the phonon drag effect. Basic concepts of the first principles method (density functional theory) and an interpolation scheme for the fast determination of electron-phonon coupling matrix (Wannier interpolation) are presented, with focuses on the various scattering mechanisms. Chapter 3 compares the results on silicon with the experimental data and justifies our computation framework. Key features of the phonon drag are revealed, which uncover the fact that phonon drag is not negligible in heavily-doped samples as generally believed. Furthermore, the quantitative contribution of each phonon mode to the phonon drag Seebeck coefficient is obtained, which shows distinct difference from the contribution to the heat conduction. These findings are explored in Chapter 4, where we demonstrate an ideal phonon filter that can largely enhance the thermoelectric performance of silicon from room temperature down to lOOK. A practical phonon filter based on nanocluster scattering is also discussed to reach the limit set by the ideal phonon filter. Chapter 5 provides a summary and future works on the direction of optimizing phonon drag in a wider range of material systems. 39 Chapter 2. Ab initio approach for transport property calculations The calculation of the phonon drag Seebeck coefficient relies on the evaluation of various variables appearing in Eq. (1.14). These include the electronic band structure Ek, associated electron group velocity va(k)), phonon dispersion coq (with (with associated phonon group velocity vA(q)), electron relaxation time rT,(k), phonon relaxation time r, (q) as well as the electron-phonon interaction matrix element g,, (k, k', q). The first two are equilibrium properties describing the eigenstates of electrons and phonons, which can be obtained from density functional theory (DFT). The remaining ones require consideration of various scattering processes. In this chapter we will first describe how these variables can be obtained using an ab initio approach based on DFT. For faster convergence of the problem, we also made tricks when integrating over all the available scattering processes, which will also be discussed later in this chapter. We note that, from here on, all the calculations will be carried out on silicon. The possible extension to other materials will be discussed in the last chapter as we look forward to more material systems. 2.1. Density functional theory In obtaining the band structure and phonon dispersion of periodic solids, quantum mechanics-based density functional theory (DFT) has become a widely accepted tool, which gives information on various physical properties (electrical, thermal, optical, mechanical, etc.) of the material. This so-called first principle method originates from the famous Hohenberg-Kohn theorems for quantum mechanics 62 : Theorem 1 "For any system of interacting particles in an external potential 40 V, (r), the potential V,,(r) is determined uniquely, except for a constant by the ground state particle density no (r)" Theorem 2 "A universal functional for the energy E[n] in terms of the density n(r) can be defined, valid for any external potential V, (r). For any particular V, (r), the exact ground state energy of the system is the global minimum value of this functional, and the density n(r) that minimizes the functional is the exact ground state density no (r)" The proof of these theorems can be seen in Hohenberg and Kohn's original paper63 Here we want to discuss the consequence of these theorems. For interacting particle system with a great amount of particles, there are many degrees of freedom if one tries to solve the Schrodinger equation, namely the wavefunction will have many independent variables, each of them characterizing one electron. It therefore seems that to know the information of the whole system one must solve the wavefunction which considers every electron. However, the first theorem of Hohenberg and Kohn essentially states that only the ground state particle density is enough to know the information of the whole system (because as long as the density is known, according to the first theorem the external potential is determined, which uniquely defines the total Hamiltonian and therefore the whole system). This is a surprising result since the particle density at one point includes the contribution of all the electrons, but the theorem states that restricting our knowledge to only the particle density will not let us lose any information. This appears even more non-trivial if we notice that this theorem is exact, in the sense that it is fundamentally lying in the many-particle Schrodinger equation. Although the theorem reduces the problem of solving many-particle wavefunctions to solving particle density that only depends on r, it will not be useful until relation between the particle density and the total energy can be established, which is essentially the task of the second theorem. According to the second theorem of Hohenberg and Kohn, a universal functional can be established that relates the total energy and the particle density, and therefore finding the ground state energy becomes a minimization problem of the density functional. This is 41 why the method is called density functional theory. There are more steps and considerations towards establishing this functional, but the key idea behind DFT is already illustrated by these theorems. Because no major approximations come into DFT except the atom types and structure information, it can be regarded as an ab initio approach. We should note that there are assumptions made to speed up the calculation (so-called pseudo-potential concept, among others)62, but these do not change the quantum mechanics basis of this method and are usually well justified. We also should mention that, as described by Hohenberg-Kohn theorem, what DFT solves is the ground state of the system, which essentially assumes the temperature of the system to be zero. For equilibrium properties like band structure, DFT can usually give very accurate results compared to the experiment (except the band gap). However, the calculation of electrical transport properties like mobility and Seebeck coefficient has received less investigation, mainly because of the increasing difficulty in extracting higher-order information (coupling matrix between eigenstates compared to eigenstates themselves) from the density functional theory and also the dense mesh entailed to reach convergence. In the later chapters we will mainly focus on the problems of electrical transport property calculations and try to extend the current methodology to include the phonon drag effect. For the equilibrium properties of electrons and phonons, we use the QUANTUM ESPRESSO package 64, with the local density approximation (LDA) of Perdew and Zunger 6 and a cutoff energy of 60 Ryd. A 12x12x12 k-mesh is used for calculating the band structure and a 6 x 6 x 6 q-mesh is used for the phonon dispersion. We note that ground-state DFT calculations solve the wavefunctions Ika) with corresponding band energies, while the density functional perturbation theory (DFPT)66 can provide the phonon dispersion as well as the mode-specific perturbed potential aqV , which will be used in calculating the electron-phonon matrix element. DFPT is an efficient way to calculate the response of the system to changes of variables other than the electronic 42 degree of freedom. Examples include response to electric field (dielectric constant), response to atomic displacement (phonon), second-order response to both electric field and atomic displacement (effective charge) and so on. It is a perturbed version of DFT and therefore directly characterizes the changes due to the perturbation. More information on DFPT can be found in the literature6. 2.2. Electron-phonon interaction Key to the calculation of the phonon drag effect is the electron-phonon interaction matrix elements, which explicitly appears in Eq. (1.14). This information is also implicitly included in the electron and phonon relaxation times showing in Eq. (1.14). Here we first describe how the electron-phonon matrix elements are obtained on a dense mesh, which is required for convergence, and their effects on the relaxation times will be discussed in later sections. 2.2.1. Wannier function-based interpolation scheme The calculation of ( |ka) electron-phonon interaction VIka) requires element the knowledge of the and the perturbed potential aqAV. These can be easily calculated on coarse meshes (for example we use a 12x12xl2 6x6x6 matrix 1/2 -(k'l, gap(k,k',q) wavefunctions the q-mesh for phonons). k-mesh for electrons and a However, the stringent convergence demands the knowledge of both wavefunctions and perturbing potentials on an ultra-dense mesh (as we find, the q-mesh needs to be as dense as lOOx1 OOx 100), which is an formidable task, and only became accessible recently due to a Wannier function-based interpolation scheme 4 3,67 , allowing us to interpolate between the matrix elements from the coarse meshes to produce finer meshes. Here we illustrate the basic concept of the Wannier interpolation scheme and more information can be found in related references43,44 43 Given the information on a coarse mesh, there are various ways to perform the interpolation. A simple method is to use linear interpolation, which averages the contribution from the discrete sampling points on the mesh, but in general is only a mathematical manipulation and does not provide physical insights. Therefore the linear interpolation has accuracy limited by the mesh density used. A more accurate way should utilize the features of the physical system. In systems which only have short-ranged forces, the extent of single particle wavefunction is very localized to certain atomic site. For such systems, tight-binding model is often used to describe the electron states and calculate the band structure (here we assume only one atom in the unit cell, but it can be easily generalized) 46 Vf,k(r) - Ie 'c,,, (2.1) (r - R) m,R where $, is single particle wavefunctions for an isolated atom and R describes different unit cells. The tight-binding model describes the wavefunction as a linear superposition of the wavefunctions for isolated atoms on different sites, with coefficients incorporating the overlap. In the reciprocal space when plotting the band structure, it may seem that the system has different information at different wave vector k , which changes across the first Brillouin Zone. Indeed Eq. eikR c,.,q,(r-R) 'fnk(r)rn.R (2.1) gives the wavefunction and associated band energy for each given k . However, we see that the band structure is actually only governed by the superposition coefficients C..,, essentially because of the short-range character of the interaction in the system. This indicates that, only a coarse mesh in the reciprocal space is enough to obtain such coefficients, which then fully determine the wavefunction and thus band energy on every k-point (from coarse mesh to dense mesh). This is the key idea behind the Wannier interpolation scheme. For real materials, however, the tight-binding model is not always valid because the wavefunctions are not necessarily localized to certain atomic sites. Nevertheless, functions (denoted as f ) playing similar roles as the atomic wave 44 functions #,, in the tight-binding model can still be found46. Ak where 'nk (r) = R e Rf(r, (2.2) R) (r) is the true Bloch wavefunction. This is because we can always define them through the Fourier transform of the true Bloch wavefunctions f,(r, R) = - f dk (r) eik- (2.3) VO which also shows that f must has the form f(r, R) = f(r - R) because as the both r and R is displaced by a Bravais lattice vector f(r - R) into Eq. VA (r) = f is not changed. The insertion of ek-Rf(r, R) (2.2) makes R direct analogues to the tight-binding model shown in Eq. V, eik-R cnn, (r - R) (r) = mR (2.1) and these functions (f(r - R)) are known as Wannier functions6 8 . The Wannier interpolation scheme essentially is trying to set up a tight-binding model from the information (in our case electron wavefunctions and perturbed potentials) on a coarse mesh 43, so that information on any point in the reciprocal space can be obtained similar as fl(r) -le what Eq. ikR nin (2.1) describes. (r-R) rn.R However, we need to mention that states defined by Eq. (2.3) are not necessarily localized dk -e-*k-R Vk (r) (R)= Wannier VO in the real space. To achieve a meaningful tight-binding model, another key concept is to combine different bands, whose superpositions may lead to more localized states. There has been development on how to achieve the maximal localization of such states via the Fourier transform of the Bloch wavefunctions to the real space and the result also depends on the definition of the extent of the localization . Here we will adopt the concept known as the maximally-localized Wannier functions6 9 , which have been shown 45 to connect with local orbitals in the material. By transforming the Bloch wavefunctions to the maximally-localized Wannier functions in the real space, a tight-binding model can be established, which can then be mapped back to any point in the reciprocal space. Above we have only explicitly discussed the electron states. For obtaining the electron-phonon matrix element, the perturbed potential is also required on a dense mesh. These can be accomplished by the same idea of the Wannier interpolation scheme. For certain phonon mode (q, A), the perturbed potential is due to a collective motion of many atoms. It has contributions from different atoms sitting on different atomic sites. Its Fourier transform gives rise to the perturbed potential due to the movement of one atom, which is intuitively seen as localized in the real space. Similarly, the dynamical matrix of certain phonon mode (q, A) is determined when knowledge of force constants (the force acting on one atom due to the movement of another atom; two atoms can be the same one) is known. The Fourier transform of them therefore gives the force constant. These are meaningful physical variables in the real space and clearly will be enough to know the phonon perturbed potentials as well as the phonon dispersion as long as the forces between atoms are short-ranged. It has been known that in polar materials, long range electric field may arise due to the zone center longitudinal optical phonon , which makes such interpolation harder and requires taking extra care. In the material we will explore in this thesis (silicon), this long range force does not occur and therefore we can safely use the Wannier interpolation scheme. We note here that the interpolation of the electron-phonon matrix element involves the Fourier transform for both electrons and phonons. The Wannier states (tight-binding model) in the real space are first established based on information on coarse meshes, and then interpolated to a finer reciprocal mesh to obtain the electron-phonon matrix element, as well as band structure and phonon dispersion. 46 2.2.2. Electron scattering by phonons We have interaction that electron-phonon mentioned leads to the so-called electron-phonon relaxation time (for electrons), described by the second term in the first E+ Fk1(k'pf,q2) = line of Eq. a) (k) ___ 1 TA (q) = 1 + r* (q) (1.10). Here we want kflqA Gq (ka, k'p) to rewrite its expression in a more explicit way (after some algebraic manipulations): r'-Ph(k) 1P ITr 2 h 1 dq Ig,6z(,q azZBBZ (nq, 2, XL + ffl n,+ q )5(E.k+ CoqA-Epk,) fl )d tgfl(kq) %A ) I f +q ,k (2.4) where the wave vector k' of the final electron state is changed according to the crystal momentum conservation. After obtaining the electron-phonon matrix element as well as other information on a dense mesh, the major problem is how to perform the integration while incorporating the energy conservation. Here we use the Gaussian smearing method for calculating the electron relaxation time. The smearing method represents the delta function as a Gaussian function with the width (in unit of energy) determined by the Gaussian broadening parameter. As the Gaussian broadening parameter approaches zero, the Gaussian function better describes the energy conservation imposed in the scattering processes. However, it should be emphasized that the mesh density must increase along with the decreasing Gaussian broadening parameter. Otherwise, the scattering rate will be underestimated because as the energy conservation condition described by the Gaussian function becomes more stringent, the sampling points that can satisfy become less, which leads to lower scattering rates. To avoid such spurious result, for given Gaussian broadening parameter the mesh density has to be large enough so that increasing the mesh density will not lead to apparent changes of the scattering rates. Considering these, we have checked the convergence with respect to the Gaussian broadening parameter, which is necessary when using the smearing-based method for the integration. 47 For the electronic transport properties of semiconductors, the major contributions come from the electron states lying close to the band edge (usually within 0.5eV from the band edge). This is because the electron distribution function generally follows the Fermi-Dirac distribution function (with only small deviations; this is why we can assume linearized Boltzmann equation before), which exponentially decays as the energy is above the Fermi level and therefore electrons with energy far above the Fermi level will only have negligible contribution to the transport properties. For this reason, a band energy cutoff (measured from the band edge) is used to select only electron states near the band edge, which also speeds up the calculation and saves the memory required to store the wavefunctions. The electron-phonon scattering is responsible for the intrinsic mobility of materials with low defect density. In Figure 2-1 we show the resulting intrinsic mobility with respect to temperature as a test to the electron relaxation times we obtain. We note here that previous first principles calculation have obtained similar agreement with experiments for the electron mobility in silicon 7' 58' 70. As is seen in Figure 2-1, overall the results agree well with the experimental data. There is some discrepancy for the hole mobility in p-type silicon near room temperature. This shows that the experimental samples experience more scattering and therefore bear a lower mobility. We speculate this to be a result of the split valence bands due to the spin-orbit coupling at valence band edge. We cannot confirm this point yet because the spin-orbit coupling is not included in our calculation. However, this discrepancy should not affect the Seebeck coefficient calculation much, because we know from the Boltzmann description of the diffusive =3N Seebeck coefficient (Eq. -I= k (E -p)VxkaAfk T1 =__N ( (afk k e (E- P)Vrk 3o4Nk ka8E 48 OE 3Nk ka l _ xka fkj k (1.11)) and phonon drag Seebeck coefficient (Eq. (1.14)) that both of them will not be changed if the electron scattering time is just changed by a single constant factor. Therefore the results on p-type silicon can provide insights into the phonon drag effect in p-type materials. 10 o 9 EPO > 2.10 E O Experiment, n-type Experiment, p-type -- DFT, n-type DFT, p-type El 1013 102 10 102 Temperature (K) Figure 2-1. Temperature dependence of the calculated intrinsic mobility in n-type and p-type silicon compared with that of sufficiently pure samples from the experiment 1 . The intrinsic mobility is calculated assuming a carrier concentration of 101 cm. 2.2.3. Phonon scattering by electrons For heavily-doped samples, electron-phonon scattering of phonons also needs to be considered for calculating the phonon relaxation time, described by the second term in 1 - the second line of Eq. Zra(k) 1 = ,+ r (k) 1 1 1 ra,(q) 4 (q) 2Fak, fqA) k'fi,qA (1.10). Here + 1 Gq,,(ka,k'/#) ka,k-6 we also want to rewrite its expression in a more explicit way: 1 1 rPh (q) 22;r h j dkX~ dk Ig a(k,q) 2 f_ X (fak 25 fk+q )()qA +Eak -Eg.) (2.5) a# Bz fBz where the crystal momentum conservation has been taken into account by changing k' 49 to k + q and rearranging the terms. This scattering has been found to account for some fraction of the reduction of the thermal conductivity in heavily-doped silicon 9 . We will show later that it is also the major cause of the reduction of the phonon drag at higher doping concentrations. Different from calculating the electron relaxation time due to EPI, here we will use the tetrahedral integration method to deal with the energy conservation for the scattering of phonons by electrons. The tetrahedral method linearly interpolates the numbers on the discrete mesh to the continuous reciprocal space, allowing analytic evaluation of the integration involving delta functions (which describes a surface in a 3D space). It has advantage in that the only parameter is the mesh density and the convergence is easily checked, while for the smearing method one must be careful to simultaneously increase the mesh density and decrease the broadening parameter. However, the tetrahedral method can be hard to achieve the convergence when the integrand has large variation in the space. Numerically we find that even for a lOOx100x100 q-mesh the electron relaxation times are still not converged using the tetrahedral method. Therefore we choose the smearing method for the calculation of the electron relaxation time. However, for the calculation of the phonon relaxation time due to EPI, although Ek still changes dramatically near the band edge (note that the conduction band of silicon has six pockets, which are very anisotropic), the variable that actually plays the role in the energy conservation is the different between two electrons states Ek - E1k q changes more smoothly (for an anisotropic band, Ek - Eaq , which for a given for a given q turns out to be a linear function). Therefore the tetrahedral function leads to better convergence in this case. We use the tetrahedral functions whenever the convergence can be achieved within the accessible range of the mesh density, because it has only one tuning parameter and the convergence is more easily checked. The integration to obtain the phonon drag Seebeck coefficient also uses the tetrahedral method. 50 2.3. Phonon-phonon interaction In most range of the temperature, the dominant scatterings for phonons (and thus the thermal conduction) are determined by the phonon-phonon interaction. The phonon eigenstates are obtained by diagonalizing the dynamical matrix, which is derived based on (harmonic) force constants. This implies that the total energy of the system can be expressed as a quadratic function of the atom displacements. However, because materials are never perfect harmonic crystals, there are also higher order force constants. For example, third order force constant describes the force acting on one atom due to the movement of two other atoms (these atoms can be the same one or different ones). In general the higher order force constants are referred as anharmonic force constants, because they give rise to the correction to the total energy which is non-quadratic with respect to the atom displacements. The anharmonicity therefore serves a perturbation to the harmonic system, allowing transitions of phonons between different states. Similar as before, phonon phonon interaction matrix element can be defined, which can be calculated given the anharmonic force constants. The Fermi's golden rule then establishes the phonon-phonon relaxation time based on these interaction matrix elements. The key component in calculating the phonon phonon relaxation time is then the anharmonic force constants. Here only third order force constants will be discussed, which have been found to be enough for achieving good comparison of the thermal conductivity with the experiment. The method we use is based on a real-space fitting approach and more information can be found in the literature 4,4. Firstly, the symmetry of the material (silicon in our case) is used to determine a minimal set of third-order force constants, which only include the interactions between atoms within certain neighbor shell of the origin. Then we use DFT to calculate forces acting on different atoms with different atom displacement configurations in a large supercell (2 x 2 x 2 conventional unit cells, 64 atoms). For harmonic force constants, each atom along each direction is moved from the equilibrium 51 by small amounts. For anharmonic force constants, we consider random atom displacements in the supercell. Combining all the force-displacement data, the harmonic and third-order anharmonic force constants are fitted together, with imposed translational and rotational invariances7. Figure 2-2 shows the resulting thermal conductivity with respect to temperature as a test to the phonon relaxation times we obtain. Excellent agreement has been achieved between our simulation and the experimental data. We note here that previous DFT calculations have obtained similar agreement with experiments for the thermal conductivity4042 in silicon. 3500 0 - -3000 Experiment DFT - 2500 '5 20001500 0 in 1000 E - jE5W 0 40 80 120 160 200 240 280 320 Temperature (K) Figure 2-2. Temperature dependence of the thermal conductivity of pure silicon compared with the experiment. The calculation is performed on a 70x70x70q-mesh. 2.4. Impurity scattering For heavily-doped samples, impurity scattering must be taken into account. Due to the lack of accurate and computationally feasible methods for calculating the impurity scattering, the effects from impurities are described using empirical models - the Brooks-Herring model for electron-impurity scattering '74 and the Tamura model for phonon-impurity scattering75. We limit the temperature range to 100K-300K for 52 heavily-doped silicon, where the electron-impurity scattering has a small influence on the phonon drag effect. This small influence lies in the fact that the Seebeck coefficient essentially represents the ratio of the temperature-gradient induced current to the electric-field driven current. When the electron relaxation time is reduced, both of them are weakened and therefore the ratio between them is less affected. The Tamura model7 5 is used to examine the effect of the ionized impurity scattering on the phonon drag effect, where the mass difference ratio AM / is chosen to be 1 to represent both the mass disorder and strain effect. We found from our calculation that phonon-ionized impurity scattering has small influences on the phonon drag effect. As a consequence, the use of empirical models in our calculation will not significantly affect the evaluation of the phonon drag. 2.5. Phonon drag modeling Knowing all the quantities in Eq. (1.14), phonon drag Seebeck coefficient can be calculated on an equal electron and phonon Brillouin zone mesh, for which the tetrahedral integration method is implemented7 6 . We also note that the final electron relaxation time rka combines both electron-phonon scattering as well as the electron-impurity scattering, according to Matthiessen's rule. Similarly, the phonon relaxation time scattering and -rq,, combines phonon-impurity both phonon-phonon scattering. Table 2-1 scattering, phonon-electron summarizes the scattering mechanisms considered in our work and how they are treated. Table 2-1. Scattering mechanisms for electrons and phonons Carrier Scattering Method Electron-phonon DFT Electron-impurity Brooks-Herring model74 Electron 53 Phonon Phonon-phonon DFT Phonon-electron DFT Phonon-impurity Tamura mode 75 To further speed up the calculation, based on the knowledge that only phonons that are close to the zone center contribute to the phonon drag effect (which becomes clear in the next chapter), we define a phonon wave vector cutoff, above which phonons will not be considered for Eq. (1.14). This cutoff has been checked and the change of the result is within 1% of the original value. Table 2-2 summarizes the parameters we used for all the transport property calculations in this work. Table 2-2. Parameters used in determining the electron and phonon relaxation times as well as in the calculation of the phonon drag effect. The parameter " a " in the last column is the lattice constant of silicon. Quantities required k-mesh (electron) q-mesh (phonon) Integration method C) (broadening Electron relaxation . time Phonon-phonon relaxation time 70' ~-M3 803 Gaussian Gaussian 703 _100 3 Gaussian (1cm') Electron-phonon scattering of phonons Phonon drag effect 70' 703 _1001 703 703 _1003 Tetrahedra Tetrahedra parameter if any) energy: 0.5eV Energy / wavevector (eycutoff q) cutoff 0.5 eV 2 q:(0.2 -2)-aq:(0.2 54 1.0 eV ~ 2) Nearest neighbor 2 nd force constant considered in the force constant (harmonic): 7 3 rd force constant fitting 41 (anharmonic): 1 55 Chapter 3. Simulation of phonon drag To justify the formalism and our numerical implementation clarified in previous chapters, we will first examine the temperature and carrier concentration dependence of the phonon drag effect and compare with the experimental results. The phonon drag Seebeck coefficient in a lightly-doped silicon is studied first, which we will refer as intrinsic phonon drag (no effect of doping concentration comes in). Then we will discuss how the increased carrier concentration reduces the magnitude of phonon drag. With the information revealed by the calculation, we will provide detailed mode contribution to the phonon drag and uncover several key features that will lead to the optimization of phonon drag in heavily-doped samples in the next chapter. 3.1. Intrinsic phonon drag Here we first examine the intrinsic phonon drag contribution to the Seebeck coefficient for electrons and holes in silicon. Here "intrinsic" means that the boundary scattering is omitted and low doping levels are examined, implying that impurity scattering 6 as well as the phonon scattering by electrons 59' 77 is negligible. Correspondingly, experimental data with larger sample size and lower net doping concentration is chosen for comparison. As shown in Figure 3-1, good agreement is obtained between the calculation results and the experimental data' 2 from 300K down to 60K for electrons and to 80K for holes, validating the applicability of Eq. (1.14). An extremely dense sampling mesh of 100x100x100 q-points in the phonon Brillouin zone is made, which is necessary for the convergence at very low temperatures. It is seen that the diffusion contribution to the Seebeck coefficient changes slowly with decreasing temperature. On the other hand, the phonon drag part increases dramatically at low temperatures and is at least one order of magnitude larger than the diffusion part below 80K. At room temperature, the phonon drag still contributes to a sizable fraction of the total Seebeck coefficient, 30% for 56 electrons and 40% for holes. This has only been inferred previously based on theoretical models 78 and quenched thermopower experiments60 . From the first-principles approach, we clearly verify that for lightly-doped silicon, even though the phonon drag effect is only dominant at very low temperature, it has influences across a wide range of temperatures, extending to above room temperature. 0 Experiment ----Total Seebeck . Diffusion part (a) 0 -- 104 Phonon drag part. 1 Experiment ---- Total Seebeck .--.. Diffusion part -- "Phonon drag part 5 > '. ............................. 3 50 (b) 100 250 200 150 Temperature (K) 50 300 100 250 200 150 Temperature (K) 300 Figure 3-1. Intrinsic phonon drag effect for (a) electrons and (b) holes in lightly-doped silicon. The open circles and squares are taken from the experiment , with the corresponding net doping concentration of 2.8x1014cm- for electrons and 8.xO14cm- for holes, respectively. Lines are first principles results assuming the same doping concentrations. Dotted lines represent the diffusion contribution to the Seebeck coefficient while dash-and-dot lines represent the phonon drag contribution on a semilog plot of the Seebeck coefficient with respect to the temperature. The phonon drag contribution increases dramatically as the temperature decreases and converges to the total Seebeck coefficient, shown by the dashed lines. 3.2. Saturation effect 3.2.1. Reduction of phonon drag at high doping concentrations To optimize zT, the carrier concentration is another common experimental variable and usually sits around 1019 to 1021 cm-3 , for achieving higher electrical conductivity 9 . It was experimentally observed that, higher carrier concentration causes a reduction of the phonon drag effect - called the "saturation" effect by Herringio - which is beyond the intrinsic phonon drag regime. In Figure 3-2(a), the Seebeck coefficient as a function of 57 carrier concentration in n-type silicon is shown. The intrinsic phonon drag Seebeck coefficient is independent of the carrier concentration. This can be understood because for lightly-doped samples the carrier concentration plays a role in Eq. (1.14) only via the position of the Fermi level Ef , which affects the occupation numbers of available electrons fA. and the electrical conductivity u through the same exponential term exp(Ef / kBT) and therefore these factors cancel each other. As is clear in Figure 3-2(a), the total Seebeck coefficient combining (black dotted curves in Figure 3-2) the diffusion contribution and the intrinsic phonon drag agrees well with experiment, up to 1017 cm 3 doping concentration. As the carrier concentration increases above 1017 cm-3 , an apparent discrepancy occurs between the dotted curves in Figure 3-2(a) and the experiment. At higher carrier concentrations, several scattering processes start to change the transport properties. Impurity scattering of electrons can largely decrease the mobility but is found from our calculation to have only a small influence on the phonon drag effect (see section 2.4). It is the scattering of phonons that reduces the non-equilibrium degree of phonons, therefore leading to a significant reduction of the phonon drag effect, as shown in Figure 3-2(a). Our calculation suggests that phonon scattering by electrons 59' 77 is the major reason for this saturation effect (discussion in the next section), which leads to a further decrease of the total Seebeck coefficient at high carrier concentrations. After taking into account the scattering of phonons by electrons, the reduction of phonon drag at high carrier concentrations is well captured and agrees well with the experiment. In Figure 3-2(b) we also show the doping concentration dependence of the Seebeck coefficient for p-type silicon. Similarly, the diffusion part alone cannot explain the experimentally observed values. With the phonon drag effect considered, the total Seebeck coefficient agrees reasonably well with the experiments (take into account the scatterings of phonons by electrons). The small discrepancies which increase at lower 58 temperature in the low doping concentration range could be a result of the spin-orbit split bands at the valence band edge. This effect is not included in this calculation because the 3000 1 .. ---------- - 150- .... 4. *% 4000 ---------- 0 44 1000 500. 500 C 14 10 1 2000 drag part 1500-Phonon 1500 0 2500 % 2000 1000 Experiment 200K Experiment 300K Total Seebeck --Diffusion part Phonon drag part 13 Experiment 200K 0 Experiment 300K -- Total Seebeck Diffusion part 2500 - spin-orbit coupling has been omitted. - - 1 10 - - 6 - - 1 - - 6 - - - 10 10 10 10 Doping concentration (cm-) 0 - - 1014 15i 1617 18192 10 10 - - 10 - -- 10 -. 10 - - 10 - ~ 10 10 Doping concentration (cm-) Figure 3-2. Calculated Seebeck coefficient with respect to doping concentrations for (a) n-type silicon and (b) p-type silicon at 300K and 200K on a semilog plot. The solid lines describe the calculated results 12 at 300K while dashed lines represent 200K. Circles and squares are taken from the experiment . At each temperature the total Seebeck coefficient (black) as well as the decomposition into the phonon drag part (red) and diffusion part (green) is shown. Dotted lines are the total Seebeck coefficient calculated using the low doping level value of the phonon drag contribution and assuming this value will not be reduced as the doping concentration increases, therefore neglecting the "saturation" effect. After taking into account electron scattering of phonons, the total Seebeck coefficient (black solid lines for 300K and black dashed lines for 200K) agrees with experiments across the full range of the doping concentration. In spite of the saturation effect, phonon drag at high carrier concentrations cannot be 3 simply ignored. As is seen in Figure 3-2, at 1019 cm- doping concentration, the phonon drag contribution to the Seebeck coefficient is comparable to the diffusion contribution for both n-type and p-type silicon. This indicates that, in heavily-doped silicon samples, phonon drag can still play an important role in the Seebeck coefficient, which will be underestimated if phonon drag is totally neglected. This is contrary to what is generally believed (high doping concentration destroys the phonon drag) and crucial to our utilization of the phonon drag for improving thermoelectric performance. We also want to note that, for the saturation effect, only temperatures down to 200K 59 are examined. Results for 100K will be provided when analyzing the optimized doping concentration but not here for the saturation effect. This is because at low doping concentrations when the temperature is below a certain value (-100K for silicon from a simplified dopant model), carriers will freeze out, which means that the carrier concentration will drop below the doping concentration. In this case, most of the electrons are trapped in the dopant positions and are no longer "free electrons" that will contribute to the conduction. As a result, the mechanism of the scattering of these electrons with phonons will therefore change. This is usually called phonon-bound electron scattering and has been studied using theoretical models80 . However, due to a lack of the suitable first-principle method, it is not yet possible to accurately capture this phenomenon which becomes dominant below 100K. Therefore, results for the saturation effect below 100K for low doping levels are not discussed in this paper. However, at sufficiently high doping levels (normally above 2x 1019 cm-3 ) the Fermi level will penetrate into the conduction band and carriers will not freeze out as the temperature is reduced. Therefore for optimization, for which the doping concentration will be high, we will still use our numerical framework to predict possible enhancement of thermoelectric performance by carefully optimizing the phonon drag effect. 3.2.2. Cause of saturation effect As we mentioned above, it is the scattering of phonons that reduces the phonon drag effect. There are two sources of this scattering as doping concentration increases. One is the impurity scattering of phonons and the other is the electron scattering of phonons. We found from our calculation that the phonon-impurity scattering is not strong enough to provide the observed reduction of phonon drag above 10" cm-3 doping concentration. In comparison, the electron scattering of phonons leads to a significant reduction of the phonon drag effect. Here we want to understand why it is the electron scattering instead of the impurity scattering that plays the major role in reducing phonon drag. This 60 difference stems from the scaling behavior of their scattering rates. As we will show below (section 3.3.1), phonons that contribute to the phonon drag effect mostly have long wavelengths (low frequencies). For long-wavelength phonons, the phonon-impurity scattering"l (scattering rate ~ C4) drops much faster with phonon frequency than the 59 phonon-electron scattering (scattering rate - c) and therefore the phonon-electron scattering is much stronger in decreasing the non-equilibrium degree of phonons that are significant for phonon drag. At sufficiently high doping concentration, we see from Figure 3-3 that the phonon-electron scattering will eventually dominate over the phonon-phonon scattering (scattering rate (02) and - as a result, the phonon drag effect is reduced as doping concentration increases (we note that the phonon-impurity scattering is small compared to the other two at low frequency range and therefore is not shown in the plot). 10i - 10 - - by phonons 10~ D-by elecrons 01 1 Phonon frequency (THz) 10 Figure 3-3. Phonon scattering rates due to phonon-phonon interaction (red points) and electron-phonon 3 interaction (blue points). The calculation is carried out for the n-type silicon with 1019 cm- doping concentration at 300K. The dashed curves show the theoretical scaling behavior of the scattering rates at long wavelength (low frequency) limit. We note that the phonon-electron scattering rate does not clearly follow the linear frequency trend. One possible reason is that the phonon frequency we examine here is still large for the frequency scaling to be well satisfied. However, the crossover between phonon-phonon scattering and phonon-electron scattering can be seen, which explains why low frequency phonons get more scatterings due to increased number of electrons. 61 3.3. Mode contribution to phonon drag Having discussed the dependence of the phonon drag effect on the temperature and the carrier concentration and justified our calculation by comparing with experiments, we proceed to quantify the mode contribution to the phonon drag effect, which is the key information for advancing our understanding of phonon drag. We will reveal that phonons that contribute to phonon drag and to the thermal conduction do not spectrally overlap, which leads to designs of phonon filters that can maintain phonon drag while reducing the thermal conductivity. Combined with significant phonon drag at high doping concentration discovered in the last section, this "decoupling" idea will show an enhanced thermoelectric efficiency for lower temperatures in the next chapter. 3.3.1. Phonon mode contribution In Figure 3-4(a) we show the accumulated percentage contributions to the phonon drag Seebeck coefficient and to the thermal conductivity from each phonon mode with respect to their frequencies from lOOK to 300K. It can be seen that compared with the modes contributing to the thermal conductivity, the specific phonons that are significant in the phonon drag effect have lower frequencies, indicating that they are closer to the zone center and also possess longer wavelengths (Figure 3-4(b)). This is further confirmed in Figure 3-4(c), which shows that phonons involved in the phonon drag processes have significantly longer mean free path than those that carry heat. These features were understood previously from simplified theoretical models' 82 83 , Here with the full knowledge of the spectral contribution, we can take advantage of this information to quantitatively determine how important each phonon mode is in contributing to phonon drag. In order to enhance zT, the factor S 2 / / needs to be maximized. Provided that the phonon drag contribution is non-negligible in the total Seebeck coefficient, one can ask whether we can reduce the thermal conductivity without sacrificing the Seebeck coefficient much. According to Figure 3-4(c), one can achieve 62 this by designing a mean free path selective phonon filter. For example, at 300K phonons with mean free paths smaller than 1 gm contribute around 70% to the total thermal conductivity while contributing negligibly to the phonon drag effect, implying that the thermal conductivity can be reduced by 70% without changing the Seebeck coefficient much by "filtering out" these phonon modes. At lower temperatures, the accumulated contribution to the phonon drag effect has a larger shift towards the long mean free path region compared with the contribution to the thermal conductivity. Therefore this "decoupling" strategy becomes even more effective at lower temperatures. (b) (a) 0.8 - Thermal conductivity Phonon drag (electron$ - Phonon drag (hole) -- ----- .. .. 0. .0 . 0 - tX0.8 0 0.2 0. C &0.4 ~0.2 -J Thermal conductivity Phonon drag (electron) - 30.2 (C 04 E Phonon drag (hole) 2 1 0.5 0.2 Phonon frequency (THz) 1 5 -----. -- conductivity -Thermal 0.8 -- 0 10 ,- 0.1 20 15 10 Wavelength (nm) 5 25 -- ,--- Phonon drag (electron) Phonon drag (hole) I0.6 j 30.2- ~0I 4 - ' le 1014 10 0 1 10" le 10j 10 Mean free path (pn) 102 10 10 3e Figure 3-4. Phonon mode-specific accumulated contributions to the phonon drag Seebeck coefficient and the thermal conductivity with respect to (a) phonon frequency, (b) phonon wavelength and (c) phonon mean free path. Solid lines show the contribution at 300K, while dashed lines are used at 200K and dotted lines at 100K. Green curves show results for the thermal conductivity. Red and blue curves represent n-type and p-type silicon, respectively. These results are obtained for lightly-doped silicon. The small differences between electrons and holes lie in the detailed band structures near the band edge. 63 3.3.2. Electron mode contribution Here we show the mode-specific contributions to the phonon drag Seebeck coefficient as well as the electrical conductivity and diffusive Seebeck coefficient from the electron side. This provides us the knowledge of what portion of electrons contributes to these transport properties and especially the phonon drag effect most notably. Eq. (1.14) directly presents the phonon mode-specific contribution to the phonon drag (term inside the bracket). For the electrons, we can similarly combine all the terms that are labeled with the same electron wave vector k and band number a in the summation. The result is given below for the lightly-doped n-type silicon with a doping concentration of 1014 cm-3 In general, we see in Figure 3-5 that at the same temperature the accumulated contribution curves for the three physical quantities (electrical conductivity, diffusive Seebeck coefficient and phonon drag Seebeck coefficient) almost overlap. This is because the Fermi-Dirac distribution, which modifies the population of the electrons, changes more strongly with the electron states compared to other properties such as scattering rates, and essentially confines the electron states that are important for transport properties to a small region near the band edge. Therefore we see a general monotonically-increasing accumulated contribution curve. To be more specific, we see in Figure 3-5 that, when temperature decreases, the curves move towards the band edge. This is a result of the temperature characteristics of Fermi-Dirac distribution function, which decreases more rapidly with energy as temperature decreases. As a result, the electrons that participate in the transport are more confined to the band edge at lower temperatures. At 300K, most electron states that are important for the transport properties are located within 0.2eV from the band edge, as shown in Figure 3-5(a). Because electrons are confined to the band edge, which is made up of six equivalent electron pockets, and the conduction band minimum corresponds to a wavelength of 0.67nm, significant contributions to the transport properties should come from electrons with 64 wavelength around 0.67nm. In Figure 3-5(b), indeed we see that most of the contributions come from electrons with wavelength between 0.6nm and 0.7nm. At lower temperatures, the curve becomes slightly more narrow, and the reason is the same as before: electrons become more confined to the band edge and the reciprocal space they occupy then shrinks. In terms of the electron mean free path, Figure 3-5(c) indicates that, electrons at 300K have mean free paths between 20nm and 80nm. The mean free path increases as temperature decreases, and at lOOK the majority of electrons have mean free paths around 100nm-300nm. We should note that these plots are obtained for a lightly-doped silicon. For the heavily-doped silicon, the characteristics of the energy-dependence 57 and wavelength-dependence will remain the same, meaning that electrons involved in the transport process are still confined within -0.2eV from the band edge and have wavelengths around 0.6nm-0.7nm, because the qualitative argument given above does not change. In comparison, mean free paths of electrons will decrease due to the impurity scattering, and therefore the mean free path accumulated curve will move towards the left. For example, it was known that for the n-type silicon with 1019 cm-3 doping concentration, the electrons have mean free paths below 20nm within the temperature range of . 100K-300K5 7 3.3.3. Effect of normal scattering and Umklapp scattering We have shown that phonons that participate in the phonon drag effect are closer to the zone center and therefore are characterized by small wave vectors. Besides, the electrons that contribute to the transport are located near the band edge (because the Fermi-Dirac distribution function drops fast as a function of electron energy when the electron energy is far from the band edge). These features can be clearly seen in Figure 3-6. For p-type silicon, only normal scattering will be important because the hole pockets are located at zone center and to fulfill the momentum conservation the phonon will only have a very small wave vector. For n-type silicon, we have six equivalent electron pockets (valleys) 65 but located in different directions from the zone center. The intravalley scattering, which (b) (a) 0 0 0.8- .0 C 0 0. 6- 0.8 0.6 0)0 C0. 4Fa 0. CO. 1- 0. E 2 . 7.3 7.35 Electrical conductivity Diffusive Seebeck Phonon drag Seebeck - 7.4 Band energy (eV) 0 .0 7.45 E a 4 7.5 0.2 6 - 0.5 Electrical onductivityDiffusive S sebeck Phonondnig Seebeck 0.6 0.7 Electron wavelength (nm) 0.8 Electrical conductivity -Diffusive Seebeck 0.8 - ~0. Phonon drag Seebeck (c) CL0.4 ES0.2 a 10 20 50 100 200 Electron mean free path (nm) Figure 3-5. Accumulated contribution to electrical conductivity, diffusive Seebeck coefficient and phonon drag Seebeck coefficient, with respect to (a) electron band energy, (b) electron wavelength and (c) electron mean free path. Physical quantities are labeled with different colors (blue for electrical conductivity, green for diffusive Seebeck coefficient and red for phonon drag Seebeck coefficient). In all three plots, solid curves describe results at 300K, while dashed curves represent 200K and dotted lines 100K. The results are calculated assuming a doping concentration of 1014 cm 3 . In part (a), the band energy is chosen with some arbitrary reference and the conduction band edge is denoted by 7.3eV. occurs only between electrons that are in the same pocket, involves phonons with small wave vectors. Umklapp scattering only occurs for intervalley scattering, where one electron is scattered from one valley to another. However, in such cases, phonons will have large wave vectors and therefore higher frequency, which leads to lower mean free path and smaller occupation number (see Eq. (1.14)). Therefore, the contributions from the intervalley scattering will be small and the major electron-phonon coupling involved 66 in the phonon drag effect is of normal type (intravalley scattering). (b) (a) 00/ \ -V/ 8 0 25 0 15 5 50 0 tX .11 ,7N\ .77 5 50 5 5 5 55 L G X G A 60 L G X G (c) 16 -15 14 912 -20 10 ...... 56 . C 0 2 9% IG G x L Figure 3-6. Electron mode contribution to the phonon drag effect for (a) n-type silicon and (b) p-type silicon, as well as (c) the phonon mode contribution to the phonon drag effect for n-type silicon. The phonon mode contribution to the phonon drag effect for p-type silicon is similar to that of n-type silicon and therefore is not shown here. The color bars show the log scale of the contribution to the phonon drag Seebeck coefficient. For electrons it is log (IS,, (k, a) [V/K]) where SP,, (k, a) is obtained from Eq. (2) by grouping the terms which correspond to the same electron state Yka , while for phonons it is log (IS, (q,2) [V/K]I) where SPh (q, 2) is obtained by choosing one phonon mode in Eq. (2). Red colors show larger contributions compared to yellow and green colors, while blue colors indicate negligible contributions. All of the plots are calculated on a 70 x 70 x 70 mesh with 1014 cm-3 carrier concentration at 300K. 67 Chapter 4. Optimization of phonon drag Having shown that phonons contributing most to the phonon drag have much longer wavelengths than those that carry heat and that significant phonon drag contributes to the Seebeck coefficient even at high doping concentration up to the room temperature (300K), we now proceed to quantify how one can benefit from utilizing the phonon drag effect. We have uncovered that, although phonons play roles in both the phonon drag and thermal conduction, different phonons have different contributions. In order to utilize the phonon drag, one seeks to reduce the thermal conductivity with minimum influences on the phonon drag (thus Seebeck coefficient), by taking advantage of the difference in their spectral contributions and selectively filtering out phonon modes. In this light, we will first identify "preferable" phonon modes, defined as those contributing more to the phonon drag than the thermal conductivity. Ideal phonon filters as well as more practical filtering mechanisms will then be discussed, which show that the thermoelectric performance in silicon at low temperatures can be greatly enhanced by reducing the thermal conductivity while maintaining significant phonon drag. 4.1. Preferable phonon modes for phonon drag Each phonon mode labeled by wave vector q and branch number A makes a contribution to phonon drag given by Eq. (1.14) and to the thermal conductivity given by K(q, 2) = 3NV quality factor (1fk ) 'q2 as the ratio between the contributions: Sh ! (ka Vka ~Tk'6 Vk'fl fka h q2(8lnq / aT) . We can define a mode-specific phonon drag q C;,A = ( q ShqA) (q, A) = 2e 22(4.1) -NkkT2 ( ka,k73 Vq(an., / aT) The material will have little use for thermoelectrics if the thermal conductivity is too high. 68 achieve when reducing the thermal conductivity), described as I i(q, A) ic. , Therefore we consider an upper bound for the thermal conductivity (as a goal we want to (q,A)EC where set C denotes the phonon modes that are involved and kr is the upper bound of the thermal conductivity. Given this constraint, the largest phonon drag contribution that one can achieve is obtained by selecting those modes that have phonon drag quality factors as large as possible, noting that max (4.2) ax,*, =i-(q, A) The quality factor defined above distinguishes the "preferable" phonon modes that are more significant in phonon drag from those that are less important, and serves as the criterion to select phonons if one seeks to maximize the phonon drag contribution. In Figure 4-1 we show the distribution of the preferable phonon modes as a function of wavelength and frequency, where it is clearly seen that more preferable modes typically have longer wavelengths and lower frequencies. In general, designs of phonon filters will require mechanisms that can provide strong scatterings for high frequency and short wavelength phonons, while have minimum influences on low frequency and long wavelength phonons. 4.1.1. Optimization of n-type silicon with ideal phonon filters First we will consider the enhancement of zT using an ideal phonon filter, which means that the optimal zT will be achieved by selecting those phonons that have larger figures of merit (Eq. C;,2 - S,, 2e (q,A) K(q, q A) - 0 VqA q 0 (_r aq <(8ng aN k T 2 P 21l ,8-fA kakp (4.1)), and then "filtering out" all other phonons. Modes with 4 /qT) T ,A from the largest to the smallest are selected to maximize the phonon drag Seebeck coefficient, until an upper 69 bound for the thermal conductivity is reached. Figure 4-2(a) shows the largest possible phonon drag Seebeck coefficient with different upper bounds for the thermal conductivity in n-type silicon. In heavily-doped silicon, it was previously believed that 3.5 3 -10 S2.5 -12 j.5 0 -16 2.5* 00 CA0 0 2 1.5 1 0.5 Phonon wave vector (1/nm) Figure 4-1. Distribution of preferable phonon modes in wave vector and phonon frequency. The lower branch describes the transverse acoustic modes while the higher branch shows the longitudinal acoustic modes (Note that they are plotted against the length of the phonon wave vector, therefore projected onto this 2D plot). Data are obtained on a 70x70x70 mesh and only long-wavelength phonons 4 1 are shown. The color bars show the log scale of the phonon drag quality factor - ln( 4q,) ( ,, in unit of m -V/W ). Red colors represent higher phonon drag quality factors (;2 than blue colors. The gradually changing background represents the impurity scattering exploited as a phonon frequency selective mechanism, where low frequency phonons are less scattered. the phonon drag effect is completely suppressed, especially when one also tries to reduce the thermal conductivity. State-of-the-art material synthesis techniques have shown the capability of reducing the room temperature thermal conductivity of silicon to below 4 W/mK'&.Our results show, however, even at such a low value of the thermal 3 conductivity in a 1019 cm- doped n-type silicon sample, there still can be a phonon drag contribution that is about 25% of the diffusion contribution, if preferable modes are chosen carefully. This reduced thermal conductivity and maximized phonon drag should 2 lead to enhancement of the factor S I C compared to the original bulk material. In Figure 4-2(b), it is clearly seen that the phonon drag effect can be utilized to boost zT by 70 a factor of 20-30 if preferable phonon modes are carefully selected. Without the phonon drag effect, the enhancement of the factor S2 / K is around 10, which does not change too much between 200K and 300K. The reason is that the diffusion contribution to the Seebeck coefficient decreases while the thermal conductivity actually increases as the temperature decreases. If we assume the same reduced thermal conductivity, the reduction of the thermal conductivity at lower temperature is larger and benefits the S2 / K factor more. However, the Seebeck coefficient also decreases so that we do not gain much from lowering the temperature. The situation is different if the phonon drag effect is included. First, because the phonon drag magnitude is comparable to the diffusion contribution, the inclusion of phonon drag with selective phonon modes helps to boost S2 / (for instance by a factor of 2 at 300K). Besides, when the temperature is lowered, the phonon drag effect becomes even more pronounced and therefore makes the enhancement of S2 be utilized to boost even larger. These results show that the phonon drag effect can / S2 / K and therefore to enhance zT at lower temperatures as well. Figure 4-3(a) compares the zT when selecting preferable modes with that when neglecting the phonon drag effect, assuming that the thermal conductivity is reduced to 4 W/mK. The optimized zT for normal bulk silicon is -0.01 at 300K around 4x101 9 cm-3 doping concentration1 4 , which can be boosted to -0.25 by combining the optimized phonon drag effect and the reduced thermal conductivity. Omission of the phonon drag effect will diminish such enhancement by half. As we mentioned, the benefit from the phonon drag becomes more pronounced, which is clearly seen in Figure 4-3(b), where we fix the doping concentration to be 4x101 9 cm- 3 and vary the temperature. The zT enhancement increases as the temperature decreases, reaching a value of 30 at 200K and can be as large as 70 times at 100K. This striking result clearly shows the importance of recognizing the different spectral distributions of phonons contributing to the phonon 71 drag effect and to thermal conduction. (b) (a) 500- - 400 - 0 with Sph, 300K 30 - ---- 300K with Sph, 200K E25 - --- '200K ~300--------------E 201 ;_ 10 14 cm-3, 300K 10 -10 19 cm-3, 300K 100 . .-- :32.2222 -10 19 cm-3, 200K 0 10 20 30 410 5 1 Thermal conductivity(W/(mK)) 10 10 Doping concentration (cm-) Figure 4-2. (a) Contribution of the most preferable modes to the phonon drag Seebeck coefficient at 2 different reduced thermal conductivity values and (b) the enhancement of the factor S / K as a function of doping concentration when phonon modes are selectively scattered. In part (a), for lightly-doped silicon, we see that the thermal conductivity can be reduced to 30 W/(mK) before observing significant diminishment of the phonon drag effect. Dashed lines represent the diffusive Seebeck coefficient for heavily-doped silicon at different temperatures. For heavily-doped silicon, the phonon drag part is still non-negligible and becomes larger compared with the diffusion part when the temperature is decreased. In part (b), solid lines represent the results where phonon drag is included and preferable phonon modes are chosen, while for the dashed lines it is assumed that phonon drag is neglected. The results examined in (b) assume that the thermal conductivity is reduced to 4W/(m- K) for all the curves. 4.1.2. Optimization of p-type silicon with ideal phonon filters We have also analyzed the optimization of phonon drag effect in p-type silicon, as shown in Figure 4-4. Comparing results from n-type and p-type, we see that p-type silicon has a slightly larger phonon drag contribution to the Seebeck coefficient compared 3 to n-type silicon. For example for 1019 cm- doped silicon at 300K, the n-type silicon shows a phonon drag contribution about 230pV/K while p-type silicon shows a number 72 around 350ptV/K. For p-type silicon, the largest phonon drag Seebeck coefficient that can be achieved drops below the diffusion part when the thermal conductivity is reduced (a) 0.25 Phonon drag S + reduced -- E -*"'4x10 7 Reduced 19 cm- \ S0.2 --- None 60 E 50 0.15 U040- _ S0.1- (b) so oC 1;130 20 0.05 10 . 0 1018 ....................... 20 19 10 Doping concentration (cm-) 100 10 200 300 Temperature (K) Figure 4-3. (a) The enhancement of zT compared to bulk crystal achieved by selecting preferable modes at 300K for n-type silicon with respect to the doping concentration and (b) the zT enhancement at a 3 doping concentration of 4 x 1019 cm- as a function of the temperature. In calculating zT, the experimental data is used for the electrical conductivity as a function of doping concentration for n-type 85 silicon , and we assume that the electrical conductivity stays the same. to 20W/(m-K) at 300K (10W/(m-K) at 200K). At lower temperatures the phonon drag effect becomes more pronounced, which is the same for both n-type and p-type 2 silicon. By carefully selecting preferable phonon modes, the ratio S 1 in p-type silicon can be enhanced by a factor of 10-20 between 200K and 300K, which is a factor of 2-3 larger than the case when the phonon drag effect is neglected, as shown in Figure 4-4(b). This enhancement is slightly smaller than that in the case of n-type silicon (Figure 4-2(b)). This can be understood if we compare Figure 4-2(a) with Figure 4-4(a), where we see that in n-type silicon the curve representing the largest phonon drag Seebeck coefficient drops significantly only after the thermal conductivity is largely reduced while in p-type silicon phonon drag reduction is seen when thermal conductivity is still large. It indicates that phonons that are involved in the phonon drag effect in p-type silicon are not as close to the zone center as those in n-type silicon, which is a manifestation of the 73 different band structures for n-type and p-type silicon near the band edge. (a) 600 0 500 20 -- with Sp, 300K --- 300K with S 200K 200K - -- ------ - - ----- - - - E - .-- -- - - 2400 (b) '"0 700 300 - 14 200 -10 100 - ---- cm-3 cm-3 10 a-10 300K co 300K- 1019en-3, 200K u0 20 10 40 30 1020 le 1019 10181 50 19 Thermal conductivity (W/(mK)) Doping concentration (cm-) Figure 4-4. (a) Contribution of preferable modes to the phonon drag Seebeck coefficient at different reduced values of the thermal conductivity and (b) the enhancement of the factor S2 / K as doping concentration for p-type silicon. In part (a), solid lines represent the phonon drag part of the Seebeck coefficient while dashed curves describe the diffusion part. In part (b), solid lines represent the results where phonon drag is included and preferable phonon modes are chosen while for dashed lines it is assumed that phonon drag is neglected. The results examined in -part (b) assume that the thermal conductivity is reduced to 4W/(m.- K). 4.2. Other Phonon filters While the discussions above set the upper bound for the enhancement of S2 / K by examining the effect of an ideal phonon filter, in practice it is not easy to arbitrarily select phonon modes Sh(q, A) K(qA) solely 2e o-NkT 2 based on their quality kf"6) vq,,no,, q (rkaVkark'#Vk,6)-f a VqA(anfl / T) factors 21-1 h (Eq. (4.1)). Nevertheless, simple selective mechanisms can be devised based on one single variable, such as frequency or wavelength. For example, nanoclusters can be used as impurities to selectively scatter phonons with different frequencies. Impurity scattering is generally 74 stronger for phonons with higher frequencies and therefore serves as a low-pass filter. 4.2.1. Nanocluster scattering for frequency selectivity We propose to make use of nanocluster scattering to effectively scatter high-frequency phonons. Nanoclusters are clusters that have impurity atoms different from the host atoms with sizes ranging from sub-nanometer to a few nanometers. One extreme case of the nanocluster is a single impurity atom embedded in the host, for which the theoretical model developed by Tamura can be used to estimate the phonon-impurity scattering rate 75. For clusters that contain more than one impurity atom, there has been development of first principles approach based on Green's function calculation8 6'8 7 , which can provide more accurate results. For simplicity, we will not use such a rigorous method to describe the nanocluster scattering. Instead, we use an analytical formula86 generalized from the Tamura model for the description of the nanocluster scattering effect. In the Born approximation, it can be shown that the phonon-nanocluster scattering rate is Ti. (q,) -- 12N ~-D _ M (coq) (4.3) F D* (o 2) 61 6 q'A' e*.(q', ') E,(qA) .IS,15 -fq(2 -C L where N is the total number of unit cells, f is the volume fraction of the nanoclusters, AM is the mass difference of the impurity atom and the host atom, M is the average mass of all the atoms, %Ax describes the phonon frequency and E,(q,A) is the unit vector along the polarization of the atom labeled by o in the unit cell. SAq is the structure factor with the sum includes all the unit cells occupied by one nanocluster. D*(oq2) can be regarded as a generalized phonon density of state. It can be shown that when the nanocluster contains only one impurity atom (the structure factor is one in this 75 case), D*(Cq2,) reduces to the normal phonon density of state, and as a result, Eq. (4.3) is essentially the same as the Tamura model. The unit vectors along the polarizations of the atoms as well as the phonon frequencies are obtained from first principle calculations. The mass fraction term AM _ M is chosen to be 1 to represent both mass disorder and force constant disorder. This is a typical number for alloys. For example, if the host is silicon, then the addition of germanium atoms act as impurities with a mass fraction of around 1.6. We test nanocluster size up to 1nm (this is the equivalent diameter defined through the total volume of the unit cells contained in the nanocluster). For the value of Inm, electron wavelengths are comparable to the nanoclusters size (see section 3.3.2). We can use the geometric limit to estimate the upper bound for the electron-nanocluster scattering, which gives a corresponding mean free path of Aw,,,,c, - 3 3f ~ 330nm , where r is the characteristic radius of the nanoparticle and chosen to be 0.5nm for estimation (volume fraction f here is chosen to be 0.2%, which is the maximum value we set). For nanoclusters that are smaller, the geometric limit becomes smaller. However, the wavelengths are now large compared to the nanocluster sizes and enter into the Rayleigh scattering regime, where the scattering rate falls below the geometric limit. Therefore Amvwpaice should be on the order of 300nm or even larger. From previous work on first principles calculation of silicon57 we know that for the doping concentration of 1019 cm 3 the electron mean free paths are less than 20nm. The comparison with A indicates that the dominant scatterings for electrons still come from the phonons and dopants. Therefore the nanocluster scattering for electrons can be neglected and the electrical conductivity is barely affected. Combining the phonon-nanocluster scattering 76 and the normal phonon-phonon scattering rates using the Matthiessen's rule, we can calculate the modified phonon relaxation times and their effects on phonon drag Seebeck coefficient as well as the thermal conductivity. The enhancement ratio of S 2 / ic and thus zT can then be obtained. Figure 4-5 shows the effect of the nanocluster scattering on the enhancement of zT at 300K and 200K. In the volume fraction range we explored, the electrical conductivity is barely affected. A large enhancement of zT can be seen, which is due to the fact that the thermal conductivity is largely reduced while the Seebeck coefficient is less affected. An optimal nanocluster size which is Inm in diameter with a volume fraction of 0.2% (Note that we have confined the volume fraction to be within this range because the scattering model is no longer appropriate as the volume fraction becomes very large), is found to enhance zT by a factor of 5 at 300K, for which a significant portion of the Seebeck coefficient comes from the phonon drag, and the neglect of the phonon drag effect will compromise the enhancement. At lower temperatures, this benefit becomes even larger, with the enhancement reaching 7 times at 200K using Inm nanocluster with a volume fraction of 0.2%. Generally, at the same volume fraction, nanoclusters with larger size scatter phonons more strongly. This fact is known for decades5 and is utilized here to select low-frequency phonons. However, nanoclusters that are much larger will also significantly reduce the phonon drag effect. This is the reason why we will see an optimal choice for the size of the nanoclusters, which turns out to be around Inm for silicon at a doping concentration of 1019 cm-3. This example using phonon frequency filtering again emphasizes that the phonon drag effect is not negligible and can be engineered to enhance zT even for heavily-doped silicon around and below room temperature. We also want to briefly comment on the use of frequency selectivity in p-type silicon. Similar to n-type silicon, the thermoelectric figure of merit zT in p-type silicon can also be enhanced using a low-pass phonon frequency filter, as shown in Figure 4-6. Here we only calculate the single impurity case to illustrate the concept. Separated impurities can be viewed as an extreme case of the nanoclusters (one nanocluster only contains one 77 impurity atom). As mentioned above, in this case the formula we used to describe the nanocluster scattering (Eq. (4.3)) essentially reduces to the Tamura model. From Figure 4-6, we see that the enhancement of zT is slightly smaller than that in n-type silicon (compared with the red solid lines in Figure 4-5). The reason for this is that at the same doping concentration, the effects of electron-phonon scattering on phonons are different. It turns out that in p-type silicon the phonons are more strongly scattered, which leads to a lower thermal conductivity in p-type than that in n-type at the same doping concentration5 9. Therefore assuming the same reduced thermal conductivity implies that the p-type silicon gains a smaller benefit. We note that this gain in zT is guaranteed because the phonon drag Seebeck coefficient is less affected while the thermal conductivity is largely reduced. (b) (a) 8 6 single impurity + phonon drag 7 -O-- 0.77nm + phonon drag Inm + phonon drag 6 ,. single Impurity -Ar- 0.77nm -- A--1nm 0 -4- single Impurity + phonon drag -0-- 0.77nm + phonon drag 5 -- O"1nm + phonon drag -"-single impurity * 4 -Ar0.77nm L",-1nm E S2.0 0 2-# 0 0.00 .5002 0.0005 2 0.005% 0.002 0.02% 0.05% 0.2% Volume fraction of nanoparticles Volume fraction of nanoclusters Figure 4-5. The enhancement of the thermoelectric figure of merit zT with respect to the volume fraction of nanoclusters using phonon frequency selectivity for n-type silicon with a doping concentration of 1019 cm-3 at (a) 300K and (b) 200K. Curves labeled with phonon drag include the phonon drag contribution to the Seebeck coefficient, while others negelct the phonon drag effect. The single impurity case is an extreme case of nanocluster scattering, where one nanocluster only contains one impurity atom. For nanoclusters with more than one impurity atom, we calculate the equivalent diameter corresponding to the total volume of unit cells contained in that nanocluster. We note that the 0.77nm size contains 6 unit cells, while the lnm size contains 14 unit cells. 78 19 cm, -3'300K, 101 phonon drag 3 -"'1019cm , 200K, phonon drag 1.5 - -A. 19 cm-, 300K -Ar 1 19 cm3, 200K E 0.5- -- - ~ -- - -- --0.2% 0.05% 0.02% 0.002%0.005% Volume fraction of impurities Figure 4-6. The enhancement of the thermoelectric figure of merit zT if single impurities are used to scatter short-wavelength phonons preferentially. Dashed curves describe the results for which the phonon drag effect is neglected. 79 Chapter 5. Conclusion 5.1. Summary In summary, the phonon drag effect is investigated in detail in this work to study the possibility of enhancing the thermoelectric performance around and below 300K via first-principles simulation. Although it is widely believed that the phonon drag effect is only dominant at very low temperature and will be largely suppressed when the carrier concentration becomes higher and especially after the thermal conductivity is reduced, we clearly show that even for silicon with a 1019 cm-3 carrier concentration at room temperature, the phonon drag contribution to the Seebeck coefficient is still appreciable, the neglect of which leads to a significant drop in the enhancement of zT. The benefit of this aspect of the phonon drag effect becomes greater when the temperature is decreased. Moreover, we have proposed filtering mechanisms based on the identification of preferable phonon modes. An ideal upper bound as well as more feasible phonon filtering approaches (including nanocluster scattering as a frequency selective mechanism) are discussed, which show the enhancement of zT coming from the resulting reduced thermal conductivity and optimized phonon drag effect. 5.2. Future work The computational approach we developed to solve the electron-phonon coupled transport for the phonon drag effect should be generally applicable beyond silicon. We envisage that along this path more material systems can be systematically studied with quantitative understanding of their coupled electron-phonon transport. Furthermore, other filtering mechanisms can be designed and engineered to better select the preferable phonon modes, thereby bringing benefit to thermoelectric applications, particularly at lower temperatures. 80 References 1. Bardeen, J., Cooper, L. & Schrieffer, J. Theory of Superconductivity. Phys. Rev. 108, 1175-1204 (1957). 2. Budai, J. D. et al. Metallization of vanadium dioxide driven by large phonon entropy. Nature 515, 535-539 (2014). 3. Bloch, F Bemerkung zur Elektronentheorie des Ferromagnetismus und der elektrischen Leitfahigkeit. Z. FUr Phys. 57, 545-555 (1929). 4. A. Sommerfeld and H. Bethe. Handb. Phys. (Springer, 1933). 5. J. M. Ziman. 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