RFIC Test System
Test Solution for Power Amplifier and Front End Module Characterization
System Features
• Support for 802.11a/b/g/h/n/ac, UMTS,
LTE, and LTE-Advanced technologies
• Getting started LV, C and .NET example
programs for DPD, Power Servo and
Envelope Tracking
• Measure harmonics up to 26.5 GHz
Envelope Tracking Reference Solution
• Industry leading baseband-to-RF
synchronization
• Customizable Vcc waveform shaping
• Advanced digital synchronization with DUT
DPD Reference Solution
• Measure AM-AM and AM-PM using
modulated waveforms
• Implement both lookup table (LUT) and
memory polynomial model (MPM) DPD
algorithms
Characterization & Manufacturing Test
Solutions
• FPGA-based power level servo
• 5x to 10x improvements in measurement
speed versus traditional instruments
RFIC Test System
The demands of emerging wireless standards such as LTE Advanced and 802.11ac in conjunction with RF power
amplifier (PA) technologies such as envelope tracking (ET) and digital pre-distortion (DPD) are creating new test
challenges for today’s engineers. NI PXI offers complete solutions for PA testing from initial product design to
manufacturing test. Benefits of NI PXI solutions include:
• Best-in-Class RF Measurement Performance
• Industry-Leading Measurement Speed
• Reduced Cost of Test
Modular Instruments
PXI modular instruments including RF signal
generators, RF signal analyzers, high speed
digital I/O, source measure units (SMUs),
switches, high-speed digitizers, and arbitrary
waveform generators (AWGs).
Application Software
Embedded PC
NI instrument soft front panel and reference
example software provides an easy-to-use
interface to modular instruments and is powered
by LabVIEW
As an embedded PC, a PXI controller is the heart
of the PXI system and contains a highperformance multicore processor, deep memory,
and multiple hard drive options.
RFIC Test Soft Front Panel
Customizable Example Programs
TestStand Example Sequences
Interactively characterize ET and
DPD PA’s using measurements such
as EVM, ACLR, and harmonics.
Customize your RFIC test system
more quickly by modifying ready-torun LabVIEW example programs.
Transition test plans from initial design
to automated characterization and
production test using TestStand
example sequences.
www.ni.com/pa
System Architecture
DPD, Envelope Trackin for WiFi
and Cellular Devices
DPD, ET, and Power Servo LabVIEW /
.NET Reference Examples
RFIC Measurement
Example Programs
RFIC Test Soft Front
Panel
NI RFIC Test System includes a combination of software and PXI modular instruments. The system includes an
instrument soft panel along with LabVIEW, C, and .NET example programs. In addition, NI TestStand example
sequences allow you to easily automate PA testing with test executive software.
TestStand Sequences for
Characterization & Manufacturing
NI-RFmx Measurement Driver Software
Hardware
PXI
System
Vector Signal
Analyzer
PXI
Controller
Source
Measure Unit
High-Speed
Digitizer
Arbitrary Waveform
Generator
High Speed
Digital I/P
Vector Signal
Transceiver
www.ni.com/pa
DPD Solution Overview
Digital pre-distortion (DPD) is a popular technique to correct for signal distortion and improve PA metrics such as
ACLR and EVM. Testing a PA under DPD conditions involves four key operations: characterizing device behavior,
model extraction, model inversion, and application of predistortion to baseband IQ samples.
When testing DPD enabled PA’s and front end modules, the RFIC Test Soft Front Panel allows you to interactively
apply DPD models and observe device behavior. This solution supports three DPD models, the memoryless AMAM/PM lookup table (LUT), the Memory Polynomial Model (MPM), and the Generalized Memory Polynomial
(GMP). In addition, the included LabVIEW example programs allow you to automate device testing. Because
these example programs use the same underlying measurement IP as the soft front panel – you can more easily
correlate results from the interactive and automated use case.
Performance Visualization
Harmonics Measurements
Observe improvements in spectral regrowth and
modulation quality in real time.
Measure harmonics up to 26.5 GHz using the high
performance 5668R Vector Signal Analyzer
PA Linearity Measurements
PA Performance Metrics
Observe AM-AM and AM-PM response of
the PA with and without DPD.
Use metrics such as ACLR, EVM, power, and RMS
memory to characterize PA performance.
www.ni.com/pa
DPD Solution Hardware Configuration
For DPD testing, the RFIC Test System combines multiple instruments into a single system including the NI vector
signal transceiver (VST), precision power supplies, and high speed digital I/O. The NI VST is a key element of the
measurement configuration and combines an RF signal generator and RF signal analyzer into one module. Tight
synchronization between RF signal generator and acquisition enables you to accurately measure AM-AM/PM using
modulated waveforms.
NI PXI has the added benefit of accelerating measurement speed through NI-RFmx measurement software. This
software takes advantage of multicore processors for highly mathematically complex algorithms such as the
memory polynomial DPD model.
PXI Chassis
PXI Controller
High Speed Digital
I/O & PPMU
MIPI RFFE Control
Digital
I/O
Precision Source
Measure Unit
DCout
Vector Signal
Transceiver
RFout
Stimulus
PA
Vector Signal Analyzer
RFin
Response
DPD Solution Features & Specifications
DPD Models
Supported Signal Types
• Memoryless AM-AM/PM LUT
• Memory Polynomial Model
• Generalized Memory Polynomial
•
Measurements
Included Products
•
•
•
•
•
•
•
AM-AM/PM
Power
EVM
ACLR
SEM
RMS Memory (Phase)
Harmonics
•
•
•
•
•
•
•
UMTS (WCDMA, HSPA, HSPA+), LTE / LTEAdvanced, GSM / EDGE, TDSCDMA, CDMA2k
and EVDO
WLAN 802.11a/b/g/h/n/ac
NI PXIe-1085 18-Slot PXI Chassis
NI PXIe-8135 Embedded Controller
NI PXIe-5646R Vector Signal Transceiver
NI PXIe-4139 Source Measure Unit
NI PXIe-6556 High Speed Digital I/O
NI PXIe-5668R Vector Signal Analyzer
www.ni.com/pa
Envelope Tracking Solution Overview
Envelope tracking (ET) is an increasingly popular technique to improve the efficiency of power amplifiers for
modern wireless signals with a high peak to average power ratio (PAPR). PA efficiency is highest when a PA nears
compression, an ET Power Supply (ETPS) is used to dynamically vary the power supply in conjunction with the
amplitude of a modulated wireless signal. Envelope tracking keeps a PA near compression as often as possible –
thus improving overall efficiency.
For ET testing, the NI RFIC Test Soft Front Panel transforms multiple instruments into a single measurement
experience. Instruments include the NI Vector Signal Transceiver (VST), arbitrary waveform generator (AWG),
and high-speed digitizer. The GUI provides an easy-to-use interface for synchronizing all of these instruments and
also supplies UMTS and LTE waveforms. The system also features LabVIEW, C, and .NET example code that you
can customize for automated test applications.
DPD Algorithms
Apply DPD algorithms to ET PAs to correct
for AM-AM and AM-PM distortion.
PA Performance
Observe AM-AM and AM-PM behavior of PA under
envelope tracking conditions.
Envelope Control
Applies envelope shaping and real-time
control of VSG-to-AWG delay.
PA Performance Metrics
Use metrics such as ACLR, EVM, power, and RMS
memory to characterize PA performance.
www.ni.com/pa
Envelope Tracking Solution Hardware Configuration
A critical challenge for ET PA Testing is synchronization and stable alignment of RF and Vcc signals supplied by a
vector signal generator (VSG) and arbitrary waveform generator (AWG). The RFIC Test System is based on NI PXI
instrumentation and features shared trigger and timing bus resources. This implementation produces
synchronization jitter between RF and Vcc signals that is less than 20 ps. In addition, by routing timing signals on
the PXI backplane, these results are stable and repeatable. The software includes the NI Fast ET Align measurement
which rapidly estimates RF and Vcc alignment. Finally, the envelope tracking software can simultaneously apply
DPD to the stimulus signal.
PXI Chassis
PXI Controller
Precision Power
Supply
DCout
Shaped Envelope
Vcc
Out
Arbitrary Waveform Generator
High Speed Digital
I/O & PPMU
High Speed Digitizer
MIPI RFFE Control
Digital
I/O
Ch0
Splitter
Ch1
Vector Signal
Transceiver
Power
Modulator
PA
RFout
Measure PA Behavior
Vector Signal Analyzer
RFin
Envelope Tracking Solution Features & Specifications
Synchronization
Included Products
• AWG-to-VSG Jitter: < 20 ps
• AWG-to-VSG skew resolution: 1 ns
•
•
•
•
•
•
•
•
Supported Signal Types
• UMTS (WCDMA, HSPA, HSPA+), LTE /
LTE-Advanced, GSM/EDGE, TDSCDMA,
CDMA2k and EVDO
• WLAN 802.11a/b/g/h/n/ac
NI LabVIEW System Design Software
NI PXIe-1085 18-Slot Chassis
NI PXIe-8135 Embedded Controller
NI PXIe-5646R Vector Signal Transceiver
NI PXIe-5451 Arbitrary Waveform Generator
NI PXIe-4139 Precision Source Measure Unit
NI PXIe-5162 High Speed Digitizer
NI PXIe-6556 High Speed Digital I/O
www.ni.com/pa
Power Amplifier Characterization Solution Overview
The emergence of new wireless technologies and multi-mode power amplifiers are increasing the demands on
automated power amplifier testing both in characterization and in high-volume manufacturing test. NI PXI
automated test systems deliver best-in-class RF measurement performance with test times that are typically 5 to 10
times faster than traditional instruments.
The NI approach combines high-performance modular instruments with highly innovative measurement software.
Typical automated PA test systems include a combination of modular instruments and test automation software and
test PAs that use technologies such as: GSM/EDGE, UMTS (WCDMA/HSPA/HSPA+), LTE/LTE-A,
CDMA2000/EV-DO, and 802.11a/b/g/h/n/ac
“
”
With NI PXI, we were able to reduce the characterization time of
new parts from two weeks to about a day.
Gary Shipley, Senior Engineer
Qorvo
Fast Power Level Servo Technology
A unique technology of the NI power amplifier test solution is FPGA-based power level servo using the NI Vector
Signal Transceiver (VST). Power level servo is traditionally a time consuming process. By performing the control
loop entirely on the instrument FPGA you can achieve the fastest possible power level convergence. By decoupling
the power level servo algorithm from the embedded controller and performing it on an FPGA, test software is able
to exploit dramatic measurement parallelism. This results in significant reductions in test time and test cost.
PXI Chassis
PXI Controller
CPU
Memory
Data Transfer
FPGA
Vector Signal Transceiver
Digital
I/O
PA
RFout
RFin
www.ni.com/pa
From Characterization to Manufacturing Test
The openness and flexibility of the NI RFIC Test System allows engineers to easily transition test systems from the
R&D lab to the manufacturing floor. Although the RFIC Test System is designed for product characterization, you
can duplicate the same physical hardware and measurement software for manufacturing test.
R&D Test Bench
Device Characterization
Quickly validate PA behavior using
instrument soft front panels or
reference examples.
Automate PA/FEM
characterization through easy-touse example programs
Manufacturing Test
Re-use test equipment and
characterization software such as
LabVIEW code and TestStand
sequences in manufacturing test.
PXI’s combination of fast measurement speed and small physical footprint make it an ideal test solution for highvolume manufacturing. In addition, by re-using the same equipment and test software from initial product design
through final production test, you can reduce development time and improve correlation of R&D and manufacturing
test data.
Deploying PXI in Manufacturing Test
You can deploy PXI for manufacturing test either as a stand-alone system or as part of the NI Semiconductor Test
System (STS). STS combines the NI PXI platform, TestStand test management software, and LabVIEW graphical
programming inside a fully enclosed test head.
PXI Chassis and Controller
PXI RF and Modular Instrumentation
NI RFmx Measurement Science and NI TestStand (Test Management)
STS Standardized Docking and Cabling Interface
NI PXI
NI STS T1
NI STS T2
NI STS T4
The STS enclosure houses all the key components of a production tester including test instruments, device under test
(DUT) interfacing, and device handler/prober docking mechanics. With the open, modular STS design, you can
take advantage of the latest industry-standard PXI modules for more instrumentation and computing power to lower
the overall cost of RFIC production test.
www.ni.com/pa
Hardware Specifications
NI DPD and Envelope Tracking (ET) Reference Solutions are based on a standard configuration of PXI modular
instruments. One can use these instruments with the LabVIEW Reference example code or as standalone
instruments.
PXIe-5646R Specifications (Signal Analyzer)
Frequency Range
65 MHz – 6 GHz
Bandwidth
200 MHz
Amplitude Accuracy
+/- 0.34 dB
Average Noise Floor
-161 dBm/Hz (1 GHz)
802.11ac EVM
-45 dB
LTE EVM
-50 dB
PXIe-5646R Specifications (Signal Generator)
Frequency Range
65 MHz – 6 GHz
Bandwidth
200 MHz
Maximum Output Power
+15 dBm
802.11ac EVM
-45 dB
LTE EVM
-50 dB
UMTS ACLR
65 dB
NI PXIe-5646R Vector Signal Transceiver
The NI PXIE-5646R VST combines an RF vector
signal generator (VSG) and RF vector signal
analyzer (VSA) into one module. The combination
of wide bandwidth and high-quality RF
measurement performance make the NI PXIe-5646R
an ideal solution for RF power amplifier testing.
Refer to PXIe-5646R Specifications Document for more details
PXIe-55668R Specifications
Frequency Range
20 Hz – 26.5 GHz
Bandwidth
Up to 765 MHz
Phase Noise, Typ
-129 dBm/Hz ( 1GHz)
Amplitude Accuracy
+/- 0.25 dB
Average Noise Floor
-167 dBM/Hz (1 GHz)
Tuning Speed
3 ms (1 GHz step)
Third Order Intercept
+25 dBm (1 GHz)
Refer to PXIe-5668R Specifications Document for more details
NI PXIe-5668R Vector Signal Transceiver
www.ni.com/pa
Hardware Specifications (Continued)
PXIe-5451 Arbitrary Waveform Generator
Specifications
PXIe-4139 Precision Source Measure Unit
Specifications
Max Sample Rate
400 MS/s
Max Pulse Power
500 W
Bandwidth
145 MHz
Max Continuous Power
20 W
SFDR (1 MHz)
98 dB
Transient Response
< 70 µs
PXIe-5162 10-Bit Digitizer Specifications
PXIe-6556 High Speed DIO Specifications
Max Sample Rate
5 GS/s
Clock Rates
800 Hz – 200 MHz
Bandwidth (3 dB)
1.5 GHz
PPMU Channels
24
Max Channels
4
Voltage Ranges
-2 V to 7 V
PXIe-1085 Chassis Specifications
PXIe-8880 Embedded Controller Specifications
PXI Express Slots
18
Processor
Xeon Octal Core
Total System Bandwidth
24 GB/s
CPU Clock Rate
2.3 GHz
Total Power Rating
925 W
Memory
Up to 24 GB
www.ni.com/pa
For more information on the RFIC Test system, email: rfic.test@ni.com
©2013 National Instruments. All rights reserved. LabVIEW, National Instruments, NI, ni.com, and NI CompactDAQ are trademarks of National
Instruments. Other product and company names listed are trademarks or trade names
of their respective companies. [20160729]