Electron Scattering Lead Carbon 10 nm 20 nm θB 9% 91% 17% 83% 96% 0-100% 4% 100-0% MSE 421/521 Structural Characterization Image Contrast Sample Objective Aperture Electron Beam Objective aperture removes scattered off-axis beams MSE 421/521 Structural Characterization Objective aperture removes diffracted beams Mass-Thickness Contrast Latex spheres on carbon A thickness contrast only B C Carbon-on-carbon, so only thickness contrast shadowed: thickness + mass contrast Evaporate Au or Au-Pd at an angle to increase mass contrast reverse of B MSE 421/521 Structural Characterization Staining Bacteria Rat kidney cells Negatively stained (Phosphotungstic acid) Bacillus bacterium. Tumor Cell prepared by ultramicrotomy Negatively stained Phage virus. Microtubules in animal cells MSE 421/521 Structural Characterization π I g = ξ g 2 sin2(πtseff) (πseff)2 ξg = πVc cos θ λFg (s = 0) seff = s 2 +1 ξ2g Intensity of Diffracted Beam Rocking Curve t/ξg = 1.5 ξg/ξg' = 0.1 ξg/ξo' = 0.1 -0.04 -0.02 0 0.02 0.04 Deviation Parameter (nm-1) Dark-Field bend contours in Pb3Nb2O8 Ig is periodic in t and seff. If t is constant and seff is varied bend contours MSE 421/521 Structural Characterization Thickness Fringes π I g = ξ g 2 sin2(πtseff) (πseff)2 seff = s2 +1 ξ2g Intensity of Diffracted Beam If seff is constant and t is varied thickness fringes ξg ξg = 100 nm ξg/ξg' = 0.1 ξg/ξo' = 0.1 w = 0 (s = 0) Effective extinction distance ξw = g 0 100 200 300 Thickness (nm) 400 ξ g 1+ w 2 w = sξg When other diffracted beams are present, the effective ξg is reduced. ξg MSE 421/521 Structural Characterization Moiré Fringes d1 d2 D Beat Spacing Parallel Moiré Pattern + d1 Rotation Moiré Pattern = Dp = d1 d2 d1 − d2 d1 + In general, D = = D Beat Spacing Dr = d 2sin(½α) d1 d2 d12 + d22 − 2d1 d2 cos α MSE 421/521 Structural Characterization Moiré Fringes Mg0.05Ca0.95 CO3 The local increases in Mg content slightly reduce the lattice constant, thus d spacings of the planes, resulting in the formation of Moiré patterns and some strain contrast. MSE 421/521 Structural Characterization Graphene Moiré fringes caused by [001] rotational disorder in graphene layers grown via CVD on C-terminated SiC Howie-Whelan Equations dφ o iπ iπ = φo + φ g exp(2πisz ) ξo ξg dz dφ g dz = iπ iπ φ o exp(− 2πisz )+ φ g ξo ξo sin (πts ') I g = ξ s ' g 2 1 s ' = s + ξg 2 2 MSE 421/521 Structural Characterization Howie-Whelan Equations dφ o iπ iπ = φo + φ g exp(2πi( sz + g • R)) ξo ξg dz dφ g dz = iπ iπ φ o exp(− 2πi ( sz + g • R))+ φ g ξo ξo sin (πts ') I g = ξ s ' g 2 MSE 421/521 Structural Characterization 1 s ' = s + ξg 2 2 Two-Beam Condition g Al-3wt% Li alloy Zone Axis BF DF Imaged with Al3Li spot, only Al3Li phase appears bright Dark, strongly diffracting Al3Li precipitate phase Complementary contrast MSE 421/521 Structural Characterization BF & DF Imaging Io Io object 2θ 2θ objective lens g T objective aperture T g It Id=Io-It Bright field Dark field MSE 421/521 Structural Characterization Forming Images Best contrast for s slightly positive (bright Kikuchi line just outside g) Extraneous contrast Narrower (better resolution) but poorer contrast s=0 s>0 s >> 0 Never form BF/DF images with s < 0. Defects are more visible when s > 0. MSE 421/521 Structural Characterization Crystal Defects 1Å Dislocations in Nickel MSE 421/521 Structural Characterization Twinning 001 010 [100] 100 16° c* -c* [010] 100 200 nm 020 [001] Dynamical DF image of twins/ferroelectric domains in m-Ca2Nb2O7 near the [011] zone, using the 711 reflection. The twin plane is (100). MSE 421/521 Structural Characterization High-Resolution TEM Overlapping <101> SADPs of Sr2Ta2O7 showing (020) spacings (d = 13.599 Å) of two twin variants sharing a common (151) habit plane. MSE 421/521 Structural Characterization Lattice Image 000 111 (Ca1.4Pb0.6)(Ta1.5Nb0.5)O7 MSE 421/521 Structural Characterization High-Resolution TEM Pb1.5Nb2O6.5 MSE 421/521 Structural Characterization High-Resolution TEM [111] [112] [001] [112] [110] 50 Å Pb1.6Nb2O6.6 MSE 421/521 Structural Characterization End of Lecture MSE 421/521 Structural Characterization