TIPS/JIM June 17, 2010 Agenda: INS Division News (Jerry Kriss) Status of Testing the NIRSpec Detector Subsystem (Mike Regan) 1-D Flat Fields for COS G130M and G160M (Tom Ake) STIS CCD: Housing Temperature, Darks, and Charge Transfer Inefficiency (Michael Wolfe) Next TIPS/JIM: July 15, 2010 Instruments Division News 06/17/2010 • Welcome to Paule Sonnentrucker, who recently joined the COS+STIS team as an ESA/AURA Astronomer. • HST news: o Cycle 18 results were announced last week. We hope to get Brett Blacker in for a TIPS presentation next month. The proposal statistics are insteresting: half of the awarded time is for spectroscopy, and half or that is for grism and prism observations with WFC3/IR and ACS. o Due to low demand, and to save on resources, there will not be any effort to restart NICMOS for Cycle 18. We’ll continue to hold it in reserve for future needs. Thanks to everyone who worked on the numerous restart attmpts so far. Your efforts have not been in vain since we do have a much better understanding of how to go about this if needed in the future. o Bright Object Protection training for Contact Scientists is being held today, at 2 p.m., in N420. • JWST News: o As Matt Mountain mentioned last Thursday, reviews of budget, schedule and launch date will continue this summer. o All the instruments continue in their various stages of engineering and flight model integration and test. Today you’ll hear about the NIRSpec Detector Sub-System from Mike Regan. • Housing: Our housing outlook is still uncertain, as you heard from Matt last Thursday. Whatever develops, we will still be squeezed fro 6-9 months from now until the early part of next year. For at least part of this time, we will need to double up research staff. I’ve had one WIT-team volunteer so far to pair up with a new incoming staff member. This could be a good way to help acclimatize the new staff and help with training. Other possibilities people have suggested is for staff to pair up with postdocs or RIAs with whom they share a science interest or with whom they work closely. I heartily invite more volunteers to get in touch with me. • I hope you noticed the posting of an ad for the new INS Division Head, to replace me when I go on sabbatical this fall. Applications are due to HR by July 9. • Our monthly INS Division lunch will be next Thursday, June 24, in the boardroom. • Next TIPS is July 15, 2010. TIPS/JIM June 17, 2010 Agenda: INS Division News (Jerry Kriss) Status of Testing the NIRSpec Detector Subsystem (Mike Regan) 1-D Flat Fields for COS G130M and G160M (Tom Ake) STIS CCD: Housing Temperature, Darks, and Charge Transfer Inefficiency (Michael Wolfe) Next TIPS/JIM: July 15, 2010 JWST NIRSpec Detectors Mike Regan Eddie Bergeron The Good, the Bad, and the Ugly The Ugly The bad pixels for the two NIRSpec detectors. 491 has 6.1% bad pixels 492 has 3.1% bad pixels The upper left corner of 491 shows a very high density of bad pixels. What about WFC3? WFC3 has 2.5% bad pixels The amplifiers for each strip are reset on every frame. The large amplifier jumps lead to a high total noise when we don’t use reference pixels. We can reduce the noise by not resetting the amps but it still doesn’t meet requirements Teledyne testing (non-ASIC) showed even more amplifier drift. The Bad The devices do not meet the total noise requirement. The Detectors do not meet the QE requirement. More fine scale structure appeared in the flat field after the Teledyne testing. The Good Even in a 4000 second exposure we are not dark current limited. The S/N ratio improves at a more at more than the sqrt(time) to 4000 seconds. Onboard averaging only has a small effect on the S/N Only Poisson limited observations receive a significant benefit from not averaging. Summary There are a lot of bad pixels Summary There are a lot of bad pixels The combination of high total noise and low QE leads to a 10-25% loss of sensitivity. Summary There are a lot of bad pixels The combination of high total noise and low QE leads to a 10-25% loss of sensitivity. There is a lot of small scale structure in the flat field. Summary There are a lot of bad pixels The combination of high total noise and low QE leads to a 10-25% loss of sensitivity. There is a lot of small scale structure in the flat field. Long exposures can reduce the total noise. TIPS/JIM June 17, 2010 Agenda: INS Division News (Jerry Kriss) Status of Testing the NIRSpec Detector Subsystem (Mike Regan) 1-D Flat Fields for COS G130M and G160M (Tom Ake) STIS CCD: Housing Temperature, Darks, and Charge Transfer Inefficiency (Michael Wolfe) Next TIPS/JIM: July 15, 2010 1-D Flat Fields for COS G130M and G160M Tom Ake TIPS 17 June 2010 Status of COS FUV Flat Fields • • • • • SMOV Program and Results CALCOS Processing Generation of 1-D Flats Through Spectral Iteration 1-D Flat Field Evaluation and Achievable S/N Caveats and Plans SMOV Program and Results • SMOV 11491 mapped science region of detector with WD0320-539 • 5 cross-dispersion positions with G130M, and 2 each with G160M and G140L • Different cenwaves and FP-POS settings helped separate spectral and detector features • 2-D flats were made for each grating and segment • Flats removed prominent dips due to grid wire shadowing, but induced some structure due to low S/N • 1-D correction is somewhat better than 2-D CALCOS Processing • CALCOS was designed to apply a 2-D flat field prior to spectral extraction. A unity flat is currently implemented in the pipeline. • Grid wire shadows are the largest FPN features (20% deep, every 840 pixels) • When CALCOS coadded different FP-POS exposures into an X1DSUM spectrum, features were reduced in depth, but appeared in more places • For 4 FP-POS steps, 30% of pixels were affected by grid wires • Until we have a flat field, changed CALCOS SDQFLAG keyword to ignore grid wires when creating X1DSUM spectra Generation of 1-D Flats • Spectral iteration of X1D extracted spectra used to create 1-D flats – – – – • Technique had been developed for GHRS Requires data taken at different grating settings (cenwave and/or FP-POS position) Iterate between wavelength and pixel space in merging and correcting data sets Solves simultaneously for the stellar spectrum and underlying fixed pattern noise Each grating processed separately since spectra fall at different cross-dispersion locations PID 11491 11494 11897 11491 11494 11897 Program SMOV Flat Field SMOV High S/N C17 Sensitivity SMOV Flat Field SMOV High S/N C17 Sensitivity Target WD0320-539 WD0947+857 WD0947+857 WD0320-539 WD1057+719 WD1057+719 Grating G130M G130M G130M G160M G160M G160M Cenwave 1291,1309 1309 1291,1309,1327 1600 1600 1577,1589,1600, 1611,1623 FP-POS 1,3 1, 2, 3, 4 3 1, 2, 3, 4 1, 2, 3, 4 3 Spectral Iteration Example - WD • Internal calibration system consists of two deuterium lamps illuminating a flat field calibration aperture (FCA) – Light takes nearly the same optical path as an external target – Only the science areas of the detectors are illuminated, not the wavelength calibration region – FCA (X=1750 µm, Y= 750 µm) is larger than the PSA (700 µm diameter) – Aperture mechanism moves in both dispersion and cross-dispersion directions • External flat field calibration exposures were taken through the PSA during thermal vacuum tests in 2003 and 2006 – Preserved internal lamp – Allowed characterization of illumination angle dependence between PSA and FCA Spectral Iteration Example - Busy Spectrum Final 1-D Flat Fields - G130M Final 1-D Flat Fields - G160M Flat Field Evaluation Consistency check performed by dividing final 1-D flat into each contributing flat • Grid wire shadows are nicely corrected • Detector dead spots leave residuals since spectra were taken at different Y position. These regions were never expected to be correctable and are flagged by CALCOS • Long wavelength end of segment A (X>11000) shows either misalignment of flats or low S/N effects G130M Segment Flat Field Statistics Segment A With Grid Wires No Grid Wires Data Set Total 11897 11494 11491 FLAT 0.050 0.062 0.072 0.050 RESID 0.034 0.046 0.016 FLAT 0.036 0.052 0.064 0.037 RESID 0.034 0.046 0.016 Segment B With Grid Wires No Grid Wires Data Set Total 11897 11494 11491 FLAT 0.052 0.060 0.063 0.052 RESID 0.027 0.033 0.014 FLAT 0.035 0.046 0.051 0.035 RESID 0.027 0.032 0.013 Signal-to-Noise Achieved • Distribution of P-flat variations give maximum S/N without a flat field – Histogram of variations in each NUV stripe fit with Gaussian profile – Widths indicate S/N (= 1/σ) ~ 50 per resel can be obtained without a flat • Maximum S/N for single grating setting (~14 per pixel) reached at ~700 counts/pixel • Current CALCOS X1DSUM ignoring grid wires improves global S/N by smoothing FPN • Flat fielding increases S/N close to Poisson noise for single exposures. With 4 FPPOS steps, S/N=45 per pixel possible. • Caveat - using same data to evaluate as what went into the flats, although different targets, various cenwaves, and multiple FP-POS steps were averaged Conclusions and Plans • 1-D flats show promise. Need to check against more data • Current flats cannot be used to correct old data since the flux calibration was created without flat fielding • Need to investigate why long wavelength side of segment A is so noisy • G140L still to be studied. Criteria for iteration convergence may need revision since spectrum covers only part of the detector segments TIPS/JIM June 17, 2010 Agenda: INS Division News (Jerry Kriss) Status of Testing the NIRSpec Detector Subsystem (Mike Regan) 1-D Flat Fields for COS G130M and G160M (Tom Ake) STIS CCD: Housing Temperature, Darks, and Charge Transfer Inefficiency (Michael Wolfe) Next TIPS/JIM: July 15, 2010 STIS CCD: Housing Temperature, Darks, and Charge Transfer Inefficiency Michael A. Wolfe June 17, 2010 Co-Investigators: W. V. Dixon, P. Goudfrooij, T. Wheeler Topics Housing Temperature Scaling Relation for Darks Charge Transfer Inefficiency Extended Pixel Edge Response Housing Temperature vs. Time Plot Scaling Relation Scaling Equation: (dark image)*(1 + slope*(TO - T)) Dark Rate Ratio vs. Temperature Plot Fractional Change in Dark Rate (Old Data) Fractional Change in Dark Rate (New Data) Histogram of Dark Rate Dark Normalization • • • • • New slope is 0.056/oC ± 0.004/oC New reference temperature is 22.0 oC Peak of histogram is -1.8 e-/s/pix Standard deviation is 0.4565 e-/s/pix Range of dark current is -2.2865 e-/s/pix to -1.3136 e-/s/pix Charge Transfer Inefficiency • Extended Pixel Edge Response Test at ≈ 12056.6 e- signal level (Janesick et al. 1991) Reference Janesick, J. R., Soli, G., Eliot, T., & Collins, S., 1991, “The Effects of Proton Damage on Charge-Coupled Devices”, in Proc. SPIE, 1447, 87 Extended Pixel Edge Response Test Plot Temperature/CTI Parameters Operating Temperature -83 °C Clocking Times Parallel: 23.2 ms Serial: 22 μs E center trap, P-V complex -90 °C to -60 °C, 100 μs (parallel) Largest slope for STIS is at -80 °C -40 °C (serial) CTI Dependence on Temperature Plot CTI Dependence on Time Plot Future Work • Investigate the seeming dependence of CTI on temperature. • Investigate the “settling” of the CCD. …. just to name a couple.