The Factorization Method for Imaging Defects in Anisotropic Materials Isaac Harris Texas A&M University, Department of Mathematics College Station, Texas 77843-3368 iharris@math.tamu.edu Joint work with: F. Cakoni Research Funded by: NSF Grant DMS-1106972 and University of Delaware Graduate Student Fellowship May 2016 The Factorization Method for Defects 1 / 16 The Physical Model We consider the time harmonic Acoustic scattering in R3 or Electromagnetic scattering in R2 (scalar) TE-polarization case. Inverse Problem Reconstruct the support of the defective region D0 in a known Anisotropic Material D from the measured scattered field. The Factorization Method for Defects 2 / 16 Reconstruction Methods 1. Optimization Methods: Reconstruct all material parameters which require a priori information, and can be computationally expensive. Moreover our problem lacks uniqueness. 2. Qualitative Methods: Reconstruct limited information, such as the support of the scattering object in a computationally simple manner, usually by constructing an indicator function. The Factorization Method for Defects 3 / 16 The Scattered Field usb We consider the scattering by a healthy material where we find the 1 (Rm ) with u i = exp(ikx · d). scattered field usb ∈ Hloc ∇ · Ã∇ubs + k 2 ñubs = ∇ · (I − Ã)∇u i + k 2 (1 − ñ)u i + SRC in Rm D ⊂ Rm be a bounded simply connected open region 1. Ã := AχD + I(1 − χD ) and ñ := nχD + 1(1 − χD ) 2. The matrix A ∈ Lip(D, Rm×m ) is symmetric-positive definite 3. The function n ∈ L∞ (D) such that n(x) > 0 for a.e. x ∈ D. The Factorization Method for Defects 4 / 16 The Scattered Field us0 We consider the scattering by a defective material where we find 1 (Rm ) with u i = exp(ikx · d). the scattered field us0 ∈ Hloc ∇·Ã0 ∇u0s +k 2 ñ0 u0s = ∇·(I−Ã0 )∇u i +k 2 (1−ñ0 )u i + SRC in Rm Now D0 ⊂ D be possibly multiple connected open set 1. Ã0 := A0 χD0 + Ã(1 − χD0 ) and ñ0 := n0 χD0 + ñ(1 − χD0 ) 2. The matrix A0 ∈ Lip(D0 , Cm×m ) is symmetric 3. The function (possibly complex valued) n0 ∈ L∞ (D0 ). The Factorization Method for Defects 5 / 16 Far-Field Patterns It is known that the radiating scattered fields which depends on the direction d, has the following asymptotic expansion 1 e ik|x| ∞ s ub (x̂, d) + O as |x| → ∞ ub (x, d) = m−1 |x| |x| 2 us0 (x, d) e ik|x| = |x| m−1 2 1 ∞ u0 (x̂, d) + O as |x| → ∞ |x| where the observation direction x̂ and incident direction d are in the the unit circle or sphere S = {x ∈ Rm : |x| = 1}. The Factorization Method for Defects 6 / 16 Some Related Work O. Bondarenko, A. Kirsch and X. Liu The factorization method for inverse acoustic scattering in a layered medium Inverse Problems 29 (2013) 045010. In this paper the FM is developed to reconstruct impenetrable sound soft(or hard) defects in a layer media. Y. Grisel, V. Mouysset, P.A. Mazet and J.P. Raymond Determining the shape of defects in non-absorbing inhomogeneous media from far-field measurements Inverse Problems 28 (2012) 055003. In this paper the FM is developed to reconstruct penetrable defects in an inhomogeneous isotropic media. The Factorization Method for Defects 7 / 16 The Scattering Operator Just as in the two other applications of the factorization method for imaging inside of an object we see that the Scattering operator for the ‘healthy’ material will be used in the factorization. The Operator S S : L2 (S) 7−→ L2 (S) for the healthy background where the e iπ/4 1 constant γ, is given by γ = √ in R2 and γ = 4π in R3 8πk Z S = I + 2ikγFb where (Fb g )(x̂) := u∞ b (x̂, d)g (d) ds(d). S Since A and n are real valued, the scattering operator is unitary, i.e. SS ∗ = S ∗ S = I. The Factorization Method for Defects 8 / 16 The Relative Far-Field Operator We will give a factorization for the relative far-field operator defined by F := F0 − Fb . It can be shown that the operator F is the far-field operator corresponding to only the defective region. Z (Fg )(x̂) := ∞ u0 (x̂, d) − u∞ b (x̂, d) g (d) ds(d) S The Far-Field Data 1. u∞ 0 (x̂, d) - is known from physical measurements 2. u∞ b (x̂, d) - can be computed directly since we assume A(x) and n(x) along with D are known The Factorization Method for Defects 9 / 16 Modified Herglotz Operator 1 (Rm \ {z}) be the radiating Green’s function Let G(·, ·) ∈ Hloc of the background media, ∇ · Ã∇G(·, z) + k 2 ñG(·, z) = −δ( · − z) in Rm \ {z} + SRC Define the operator H : L2 (S) 7−→ H 1 (D0 ), by Z s Hg := ub (x, d) + exp(ikx · d) g (d) ds(d). S Theorem The operator H ∗ : H 1 (D0 ) 7−→ L2 (S) satisfies the following: 1. H ∗ is compact with dense range. 2. S ∗ G∞ (·, z) ∈ Range(H ∗ ) if and only if z ∈ D0 . The Factorization Method for Defects 10 / 16 A Factorization Emerges 1 (Rm ) that satisfies Given v ∈ H 1 (D0 ) we can construct u ∈ Hloc ∇ · Ã∇u + k 2 ñu = ∇ · (Ã − Ã0 )∇v + k 2 (ñ − ñ0 )v + SRC in Rm Define the operator T : H 1 (D0 ) 7−→ H 1 (D0 ) such that Z (Tv , ϕ)H 1 (D0 ) = − (A − A0 )∇(v + u) · ∇ϕ − k 2 (n − n0 )(v + u)ϕ dx. D0 Theorem The far field operator F : L2 (S) 7−→ L2 (S) associated with the defect can be factorized as F = −γSH∗ TH. The Factorization Method for Defects 11 / 16 Analysis of the Middle Operator We define the real and imaginary part of an operators by <(T ) = T + T∗ 2 and =(T ) = T − T∗ . 2i For simplicity lets assume we have that A0 and n0 are real valued. Theorem The operator T : H 1 (D0 ) 7−→ H 1 (D0 ) satisfies the following: 1. ±<(T ) is the compact perturbation of a coercive operator 2. =(T ) is non-positive and compact Provided that A − A0 is either positive or negative definite D0 . The Factorization Method for Defects 12 / 16 Main Result (for Non-Absorbing Defects) We define the selfadjoint compact operator F] := < γ −1 S ∗ F + = γ −1 S ∗ F : L2 (S) 7−→ L2 (S). Theorem If A − A0 is either positive or negative definite in D0 , and let (λi , ψi ) ∈ R+ × L2 (S) be an orthonormal eigensystem of F] . Then " z ∈ D0 ⇐⇒ W (z) = ∞ X |(S ∗ G∞ (x̂, z), ψi )|2 i=1 λi #−1 > 0. For the results on absorbing defects see: F. Cakoni and I. Harris The factorization method for a defective region in an anisotropic material. Inverse Problems 31 (2015) 025002 (arXiv:1410.3737). The Factorization Method for Defects 13 / 16 Numerical Reconstructions i.e. plot z 7−→ W (z) Example 1. We consider D = [−2, 2]2 where the defective region is a void D0 (i.e A0 = I and n0 = 1 in D0 ) embedded in isotropic media. The coefficients in D are given by A = 0.5I and n = 3. Figure: On the left is the reconstruction of the 2 circular voids. While on the right is the reconstruction of the a circular void of radius 1. Where the wavenumber is k = 1. Dashed line: exact boundaries of the scatterer and void(s). The Factorization Method for Defects 14 / 16 Example 2. For this example we now reconstruct voids in an anisotropic square scatterer D = [−2, 2]2 .The coefficients in D are chosen to be given by n = 3 and 0.6022 0.1591 A= 0.1591 0.7478 Figure: On the left is the reconstruction of the 2 circular voids. While on the right is the reconstruction of the a circular void of radius 1. Where the wavenumber is k = 1. Dashed line: exact boundaries of the scatterer and void(s). The Factorization Method for Defects 15 / 16 Figure: Questions? The Factorization Method for Defects 16 / 16