ARD, Carderock Division, Bayview,ID
Project Professors: Dr. Herb Hess & Dr. Brian
Johnson
Summer Research Presentation
August 27th, 2008
Authors:
Jarred Coulter
Vishu Gupta
Zane Sapp

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Summary-Spring 2008
National Instruments Data
Acquisition System (DAQ)
Sensors
System Applications and
Capabilities
Future Work-Fall 2008
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Statement of Work
Deliverables
DAQ Solutions Researched
Potential Design Issues
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Designing a data acquisition system (DAQ) that will interface with the existing systems on the AESD.
Manage and display data from sensors for voltages, currents, and temperatures from the propulsion system and UPS system batteries.
Correlate above data with the GPS data available.
Graphical display: real-time and static
On board data storage buffer.
Expandable Architecture
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Report of Potential design solutions
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Recommended System Selection Report
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Working prototype
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Report on Final Configuration
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Iotech LogBook Stand Alone, Intelligent
PC-Based Data Acquisition Systems
Models 300 and 360.
Iotech MultiScan 1200.
NI Compact DAQ Series
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Making sure these Systems can operate in an ungrounded system.
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External Multiplexing controlled by the DAQ to allow for large number of inputs per channel.
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The 500V Channel to Channel Isolation or common mode voltage rating is inadequate for high voltage from batteries.
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M-Series Data Acquisition Device
1.25 Ms/s
Up to 280 Channels per DAQ Device with Current
Configuration
16-Bit ADC Resolution
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MXI-Express Connection
110 Mb/s and up to 250 Mb/s Transfer Rate
PC and Laptop Compatible
High Bandwidth Allows for Large Channel Count through
Multiple Chassis
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SCXI/PXI
Hundreds of Input Modules for wide range of Application
Rugged Chassis for Industrial Applications
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DATA ACQUISITION SYSTEM
FROM NATIONAL
INSTRUMENTS
SYSTEM COMPONENTS
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PXI/SCXI Combination
Chassis
MXI Express Link
M-Series DAQ and
PXI/SCXI Chassis
Controller
32-Channel Input
Module/Multiplexer
I/O Connector M-Series
DAQ (Not Shown)
Cast Screw Terminal Block for SCXI-1104C with Cold
Junction Compensation
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LabVIEW 8.2
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LabVIEW Signal Express
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Measurement and Automation Controller
(MAX)
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Built in VI’s for Data Acquisition, Analysis,
Storage, Display
Mathscript capabilities
Stores all data in an ASCII text file called
LabVIEW Measurement File (LVM)
DAQmx and DAQ Assistant for Easier
Programming
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No Programming Data Acquisition
Export Data Directly to Excel Spreadsheet or Text Editor
Real-Time Display
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Manage all the National Instruments
Hardware
Automatically Detects all devices connected to system
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• Isolation Amplifier Type Voltage
Transducers
• Designed my Own
• Cost Around 5 Dollars
• Hall Effect Voltage Transducers
• Capable of accurately handling very high voltages
• Cost around $250 per unit when bought in Bulk
• LEM Current Transducers
• Accurately Measure wide range of Currents
• Cost around $400 per unit when bough in Bulk
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LEM CV 3-500 FEATURES
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Closed Loop Hall Effect
Voltage Transducer
Measuring range: 0 to 500 V
Output Voltage: 0 to 10 V
(Max)
Supply Voltage: ± 15 VDC
± 0.2% Accuracy at T
A
=25 C
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LEM DC-C10 FEATURES
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DC Current Transducer
3 Jumper Adjustable
Ranges: 5, 10, 20 Amp
Max
Supply Voltage: 20-50
VDC
±1% Accuracy at
T
A
=25 C
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Monitoring of Propulsion System and UPS
System Battery Banks
Battery Status
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• Voltage
Temperature
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Charge Monitoring
Possible Feedback Control for Charging Schemes
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Fuel Cell Monitoring
Harmonics Measurement and Analysis
Measuring waveforms
LabVIEW for Transforms and Harmonic Analysis
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LabVIEW Programming For:
Data Management
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• Storage
Display
Analysis
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Switching Scheme for Controlling Sensors
Sensors Powered by Batteries
Need to be able to turn them off when not acquiring data
• GPS Interface
• Time Stamping
• Link time to Master Clock
• Location Stamping
• Onboard Data Storage Buffer
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• Testing
• Determine Latency for Real Time
• Determine Power Consumption
• Calculate Cost Per Channel for Multiple Chassis
Configuration
• Determine Bandwidth for Multiple Chassis
Configuration
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Spring 2008
SOW
Deliverables
DAQs
Design Issues
Summer 2008
• NI DAQ and LabVIEW Software
• Sensors
Fall 2008
• LabVIEW Programming
• Sensor power and control
• Onboard storage
• Testing
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ONR
Alan Griffitts
Frank Jurenka
Karl Sette
MRCI
Dr. Brian K. Johnson
Dr. Herbert L. Hess
Karen Cassil
Research Group
John Finely
Leo Lucklose
Justin Schlee
Sunan Huang
James Randall
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