Department of Electrical Engineering
University of California – Riverside
Riverside, California 92521
EE207: NOISE IN ELECTRONIC DEVICES
Spring 2004
Instructor: Prof. Alexander A. Balandin (alexb@ee.ucr.edu)
Catalog Description
The course presents in-depth study of fluctuation processes in solids and different types
of noise in electronic devices. The topics include elements of the theory of random
processes, as well as analysis of different noise types in electronic devices such as
thermal noise, generation-recombination noise, low – frequency 1/f noise, flicker,
random telegraph and short noise. Noise suppression techniques and new design
constrains due to device downscaling will also be discussed.
2
S (V /Hz )
Grading
Homework
Outside work
Final Exam
20%
30%
50%
S~1/f
Frequency (kHz)
Outside Work
The students will be offered a list of technical papers for selection of the topic for the
project and presentation. The task will be to read the paper, understand its technical
language, and make a clear presentation. The outside work will be evaluated on the
basis of presentation made in class and written report.
Literature
The course will be delivered from the instructor’s notes.
Handouts will be distributed in class. Additional recommended reading include
•
S. Kogan, Electronic noise and fluctuations in solids (Cambridge University Press,
1996).
•
A. Balandin (editor), Noise and fluctuation control in electronic devices (American
Scientific Publishers, 2002).
For more information visit: http://ndl.ee.ucr.edu/gradw.htm