Leica Microsystems Press Release

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PRESS RELEASE / PRESSEINFORMATION
March 19, 2015
Leica Microsystems Combines Advantages of Cryo Fixation,
Fluorescence Light Microscopy and Electron Microscopy in One
System
Leica EM Cryo CLEM Features the World’s First Cryo CLEM Objective
Vienna, Austria. Leica Microsystems launches Leica EM Cryo CLEM, a system that facilitates correlative
light and electron microscopy (CLEM). In CLEM, the sample is studied under the fluorescence light
microscope and the electron microscope. The system allows rapid screening of large areas and fast
determination of regions of interest which can then be quickly recognized in the electron microscope. This
can reduce up to 50% of the user interaction on the cryo electron microscope and helps users save time.
In addition, the image data from both sources can be combined, resulting in a deeper understanding of
the analyzed sample. The Leica EM Cryo CLEM system consists of a fluorescence light microscope with
cryo stage, cryo objective, and a cyro transfer shuttle. It keeps cryo-fixed samples under cyro conditions
during imaging in the fluorescence light microscope and during transfer. For the Leica EM Cryo CLEM
system, Leica Microsystems developed the world’s first commercially available cyro CLEM objective to
enable localizing of fluorescent-labeled target structures.
“Working with the Leica EM Cryo CLEM system ensures fast, safe, contamination-free sample transfer
and loading from cryo sample preparation instruments to the fixed stage fluorescent light microscope
Leica DM6000 FS, and maintains the controlled sample state during the cryo imaging,” explains Ruwin
Pandithage, Product Manager at Leica Microsystems. “Since all components of the system originate from
Leica Microsystems, they are well-matched and perform smoothly in their workflow.”
Leica Microsystems cooperation partner Dr. John Briggs of EMBL Heidelberg, Germany, says: “This will
provide a huge boost to our research. It will allow us to carry out cryo fluorescence microscopy easily,
reliably and with good image quality, and to efficiently recover the sample for correlative cryo electron
microscopy. This will make it possible to answer a whole range of exciting research questions.”
The system’s dedicated Leica HCX PL APO 50x / 0,90 CLEM objective enables researchers to define
fluorescent-labeled target structures of a size up to 100 nm. It is apochromatically corrected and has a
numerical aperture of 0.9. Its low working distance of 0.28 mm ensures high resolution cryo imaging with
a maximum resolution of 364 nm. A transfer shuttle keeps the sample under cryo conditions and
contamination-free throughout the workflow.
Anja Schué / Claudia Müller · Tel. +49 6441 29-2201 / -2630 · corporate.communications@leica-microsystems.com
Leica Microsystems GmbH · Ernst-Leitz-Straße 17–37 · D-35578 Wetzlar · www.leica-microsystems.com
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PRESS RELEASE / PRESSEINFORMATION
For more information on the Leica EM Cryo CLEM system please refer to http://www.leicamicrosystems.com/products/em-sample-prep/biological-specimens/low-temperaturetechniques/details/product/leica-em-cryo-clem/
Science Lab Article on cryo CLEM: http://www.leica-microsystems.com/science-lab/clem/cryo-clem-thecombination-of-cryo-fluorescence-microscopy-with-cryo-electron-microscopy/
Background information:

Correlative Light and Electron Microscopy (CLEM) combines fluorescence light microscopy and
electron microscopy (EM) imaging of the same sample.

Electron Microscopy delivers structural information and also the context in which the target structures
are embedded at very high resolution.

Fluorescence Light Microscopy (FLM) is a very sensitive method to localize specific structures and to
observe and analyze biological processses and functions in living biological samples.

Cryo Fixation is the sample preparation method to maintain samples in the most life-like state as
possible.

Cryo CLEM connects the benefits of all these techniques. It combines the individual advantages from
cryo fixation, FLM and EM by time-effective imaging of identical, artefact-free samples and overlaying
the complementary information to win greater understanding.
Caption
Anja Schué / Claudia Müller · Tel. +49 6441 29-2201 / -2630 · corporate.communications@leica-microsystems.com
Leica Microsystems GmbH · Ernst-Leitz-Straße 17–37 · D-35578 Wetzlar · www.leica-microsystems.com
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PRESS RELEASE / PRESSEINFORMATION
Leica Microsystems launches Leica EM Cryo CLEM, a system that facilitates correlative light and electron
microscopy (CLEM), allows rapid screening of large areas and fast determination of regions of interest
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About Leica Microsystems
Leica Microsystems develops and manufactures microscopes and scientific instruments for the analysis
of microstructures and nanostructures. Ever since the company started as a family business in the
nineteenth century, its instruments have been widely recognized for their optical precision and innovative
technology. It is one of the market leaders in compound and stereo microscopy, digital microscopy,
confocal laser scanning microscopy with related imaging systems, electron microscopy sample
preparation, and surgical microscopes.
Leica Microsystems has seven major plants and product development sites around the world. The
company is represented in over 100 countries, has sales and service organizations in 20 countries, and
an international network of distribution partners. Its headquarters are located in Wetzlar, Germany.
Anja Schué / Claudia Müller · Tel. +49 6441 29-2201 / -2630 · corporate.communications@leica-microsystems.com
Leica Microsystems GmbH · Ernst-Leitz-Straße 17–37 · D-35578 Wetzlar · www.leica-microsystems.com
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