ANNB328- Techniques in Microscopy
Instructors:
Todd Clason
Doug Taatjes
Jerry Fiekers
Office
Given E015
HSRF 208
Given D103
Phone
6-0413
6-0373
6-0404
e-mail
Todd.Clason@uvm.edu
Douglas.Taatjes@uvm.edu
Jerome.Fiekers@uvm.edu
This team-taught course will serve as an introduction to many of the microscopy
systems and techniques available at the UVM College of Medicine. The course format
consists of lectures, literature, discussions and demos. Topics include general light
microscopy and contrast techniques (DIC, Phase contrast) as well as epifluorescence,
confocal, multi-photon, super-resolution, SEM, TEM, AFM, and post-processing
(deconvolution) techniques. Applications (FRET, ion imaging, second-harmonic
generation imaging, FRAP, TIRF, FLIM etc.) will also be discussed as time permits.
It will meet twice a week: Tuesday and Thursday, from 11:30-12:45 in Courtyard S359.
Date
1/15
Topic 1
Instructor
Introduction + light properties
Clason
Diffraction/ refraction,
polarization
Basic Scope/ Kohler, resolution,
Taatjes
aberrations – part 2
Light Microscope Demo
Taatjes
Date
1/17
Topic 2
Basic Scope/ Kohler, resolution,
aberrations - part 1
Instructor
Taatjes
1/24
Taatjes
Lamps, lasers, filters, fibers
monochromators, epi-scope
design.
Calcium/ ion imaging
Ratiometric, non-ratiometric
Spectral imaging,
FRET/FRAP/FLIP/FLIM
Fiekers
2/7
Polarized microscopy, Phase,
Hoffman, DIC Catch-up
Dye chemistry- absorbance,
emission, excitation, bleaching,
uncaging
Epifluorescence demo
Fiekers
2/14
Confocal + spinning disk
Taatjes
Taatjes/
Clason
2/21
Confocal Demo
Taatjes
Midterm Review
Spring recess – no class
Multiphoton confocalIncluding SHG
TIRF – Total Internal Reflectance
Super-Resolution/TIRF Demo
Taatjes
Midterm Exam
Spring recess – no class
Multiphoton Demo
Clason
Clason
2/28
3/7
3/14
Clason
Taatjes
3/21
3/28
Taatjes
Clason
Clason
4/4
4/9
SEM – Scanning Electron
Microscopy
AFM Atomic Force Microscopy
Super-Resolution
TEM – Transmission Electron
Microscopy
EM Demo
Taatjes
4/11
Workshop #1 Specimen Prep
4/16
4/23
Post-processing deconvolution
Workshop #2
Clason
Taatjes/
Clason
4/18
4/25
Image Processing and Ethics
Review
Taatjes/Cla
son
Taatjes
Clason
4/30
Final Exam
1/22
1/29
2/5
2/12
2/19
2/26
3/5
3/12
3/19
3/26
4/2
1/31
Clason
Clason
Clason
Taatjes
Grading:
Grades are mainly based on the Midterm and Final exam. Class participation is also
considered.
Workshop sections:
These sessions will allow us to discuss specific challenges students have faced while
preparing and imaging specimens for their research. While neither session will be lecture
based, important material will be presented during both meetings.