What Have You Been Missing In Your Pulsed VNA Measurements? 8 Oct 2013 13:00h - 13:40h Presented by: Bob Buxton EuMW Seminars 2013 1 Confidence on the cutting edge Pulsed Measurements EuMW Seminars 2013 2 Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary EuMW Seminars 2013 3 Common Pulse Applications • Measure the reaction of a DUT to a pulsed RF stimulus – E.g., Radar: transmitter, receiver, or both • Measure the reaction of a DUT to pulsed IV (and pulsed RF?) – High power density semiconductors (SiC, GaN) – Traveling-wave-tube amplifiers (TWTAs) – Must synchronize with (ext sync) or control DC bias (pulse gen) • Part of active device test suite – – – – S-parameters 1 dB compression point NF, higher order distortion products, harmonics IMD, IP3 (third-order intercept point) EuMW Seminars 2013 4 Radar Courtesy of LCRS Courtesy of Telematics News Courtesy of Raytheon EuMW Seminars 2013 5 Radar Factor Pulse shape Pulse width Radar Characteristic Affected Range accuracy, range resolution Range resolution, maximum range, minimum detection range Pulse repetition frequency Maximum unambiguous range, detection probability Fundamental frequency Directivity, target resolution, propagation loss, size of equipment Range resolution Target masking, range resolution Probability of detection, angular resolution Maximum detection range Maximum detection range, physical size Maximum detection range Maximum detection range Chirp frequency bandwidth Chirp pulse ripple/time sidelobes Scan rate and beamwidth Receiver sensitivity Transmitter power Average gain Radar cross section Radar trends Narrower pulses 1 us, 150 m 50 ns, 7.5 m Wide range of PRF Lower, longer range Higher, shorter Higher frequencies Antenna size, bandwidth, smaller target sizes • Key measurement parameters: – Min pulse width/resolution, record length, range of PRFs, frequency range EuMW Seminars 2013 6 Pulsed IV (and RF) • Used with TWTAs to reduce power consumption • Used at wafer-level to avoid thermal effects – Memory \trapping effects Thermal • Electrical Key measurement parameters: – Pulse profile and min measurement width, point-in-pulse resolution, pulse-topulse and PRF range EuMW Seminars 2013 7 Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary EuMW Seminars 2013 8 Pulse Characteristics and Definitions EuMW Seminars 2013 9 • Measurement Overview Three types of stimulus: * • * Three types of measurements: Pulse Profile (PP) Point-in-Pulse (PIP) Sweep time Sweep freq or power Pulse-to-Pulse (P2P) Sweep time EuMW Seminars 2013 10 Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary EuMW Seminars 2013 11 Common Test Challenges • Too many test method trade-offs • Need for better analysis tools • Monitor pulse behavior over longer times • Eliminating measurement setup errors • Timing and synchronization issues (in measurement or calibration) EuMW Seminars 2013 12 Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary EuMW Seminars 2013 13 Time – Frequency Domains EuMW Seminars 2013 14 Traditional Trade-offs Wideband Method Trade-off: minimum pulse width limitations Historically, wideband pulse measurement is used when most pulse energy is contained in the receiver BW. As pulse widths narrow (e.g., 1 µs), users are forced to move to narrowband techniques. EuMW Seminars 2013 15 Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary EuMW Seminars 2013 16 Traditional Trade-offs Narrowband Method Trade-offs: − Dynamic range penalty − No pulse-to-pulse capability EuMW Seminars 2013 Dynamic range degradation = 20*log[duty cycle] 1% duty cycle = 40 dB D/R reduction! 17 Common Test Challenges • Too many test method trade-offs • Need for better analysis tools • Monitor pulse behavior over longer times • Eliminating measurement setup errors • Timing and synchronization issues (in measurement or calibration) EuMW Seminars 2013 18 MS4640B now with: • Option 035 IF Digitizer • Option 042 PulseViewTM • Pulse Modulator Test Sets (required for RF pulsing) EuMW Seminars 2013 19 Eliminate Trade-offs! • Option 035 IF Digitizer enables – – – – EuMW Seminars 2013 200 MHz Receiver bandwidth Measurement resolution as fine as 2.5 ns Independent measurement IF receiver windows 500 ms record lengths 20 Common Test Challenges • Too many test method trade-offs • Need for better analysis tools • Monitor pulse behavior over longer times • Eliminating measurement setup errors • Timing and synchronization issues (in measurement or calibration) EuMW Seminars 2013 21 The True View • What have you been missing? 2.5 ns resolution 15 ns resolution EuMW Seminars 2013 22 Common Test Challenges • Too many test method trade-offs • Need for better analysis tools • Monitor pulse behavior over longer times • Eliminating measurement setup errors • Timing and synchronization issues (in measurement or calibration) EuMW Seminars 2013 23 The True View Example: 100 ms PRI (100 µs, 900 µs period), 10 ns resolution, 30 MHz IFBW Record lengths up to 500 ms -- At full resolution! EuMW Seminars 2013 24 Common Test Challenges • Too many test method trade-offs • Need for better analysis tools • Monitor pulse behavior over longer times • Eliminating measurement setup errors • Timing and synchronization issues (in measurement or calibration) EuMW Seminars 2013 25 Measurement Confidence • Visual representation of signals and measurements • Simple generator configuration – Varying types of pulses generated • • • • • Singlet Doublet Triplet Quadruplet Burst – Change labels for better test descriptors EuMW Seminars 2013 26 Measurement Confidence • Simple measurement configuration – Adjustments for each receiver EuMW Seminars 2013 27 Measurement Confidence • Use Zoom Marker to double check test setup • Drag vertical lines for start and stop zoom area • Drag vertical lines as time markers EuMW Seminars 2013 28 Industry-first Instant Results • Make measurement adjustments and see the results instantly • No need to toggle back and forth between configuration windows EuMW Seminars 2013 29 Common Test Challenges • Too many test method trade-offs • Need for better analysis tools • Monitor pulse behavior over longer times • Eliminating measurement setup errors • Timing and synchronization issues (in measurement or calibration) EuMW Seminars 2013 30 Independent Rcvr Windows Coupled IF Receiver Windows • Measurement results may identify unexpected behavior • Delay start of b measurement to 2 – For example, there may be measurement delays (from group delay, properly align S21 result long test cables, …) which can affect ratio measurements EuMW Seminars 2013 31 Agenda • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties • Summary EuMW Seminars 2013 32 Calibration • Power Calibrations • Receiver Calibrations • User RF Calibrations – No stimulus pulsing – Stimulus pulsing – Receive-side modulation/gating EuMW Seminars 2013 33 Minimizing Uncertainties • • • • Time Shaping Calibration Minimizing uncertainties – Increase averaging or reduce IFBW – Maximize power (while avoiding compression) – Filtering EuMW Seminars 2013 34 Summary • Background • Applications • Measurement Overview • Common Test Challenges • Pulse Measurement Methodologies • Wideband method • Narrowband method • High-Speed digitizer method (VectorStar’s innovative architecture) • Measurement Tips and Considerations • Calibration • Minimizing Uncertainties EuMW Seminars 2013 35 Equipment Selection Criteria • • • • IF bandwidth – sampling rate Min measurement and timing resolution Measurement method trade-offs (e.g., dynamic range reduction) # of pulse generators available – Pulse generation signal formats available (e.g., doublets, bursts, …) – Min pulse width • Pulse modulator performance (e.g., on-off ratio, rise-time, …) EuMW Seminars 2013 36 What Have You Been Missing In Your Pulsed VNA Measurements? • Innovative high-speed digitizer architecture • Industry’s highest resolution measurements • Longest record lengths • Independent measurement receiver windows • Intuitive graphical configuration tool • Instant results on measurement parameter changes EuMW Seminars 2013 37 CALL ANRITSU FIRST FOR ANSWERS! 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